Bibliographic Details
| Title: |
Imaging built-in electric fields and light matter by Fourier-precession TEM. |
| Authors: |
Lorenzen, Tizian1 (AUTHOR), März, Benjamin1,2 (AUTHOR), Xue, Tianhao1 (AUTHOR), Beyer, Andreas3 (AUTHOR), Volz, Kerstin3 (AUTHOR), Bein, Thomas1 (AUTHOR), Müller-Caspary, Knut1 (AUTHOR) k.mueller-caspary@cup.lmu.de |
| Superior Title: |
Scientific Reports. 1/15/2024, Vol. 14 Issue 1, p1-10. 10p. |
| Subject Terms: |
*ELECTRIC fields, *ELECTRIC lighting, *ELECTRIC field strength, *RECIPROCITY theorems, *ELECTRON beams, *TRANSMISSION electron microscopy, *ELECTRON energy loss spectroscopy, *ELECTRON scattering |
| Abstract: |
We report the precise measurement of electric fields in nanostructures, and high-contrast imaging of soft matter at ultralow electron doses by transmission electron microscopy (TEM). In particular, a versatile method based on the theorem of reciprocity is introduced to enable differential phase contrast imaging and ptychography in conventional, plane-wave illumination TEM. This is realised by a series of TEM images acquired under different tilts, thereby introducing the sampling rate in reciprocal space as a tuneable parameter, in contrast to momentum-resolved scanning techniques. First, the electric field of a p–n junction in GaAs is imaged. Second, low-dose, in-focus ptychographic and DPC characterisation of Kagome pores in weakly scattering covalent organic frameworks is demonstrated by using a precessing electron beam in combination with a direct electron detector. The approach offers utmost flexibility to record relevant spatial frequencies selectively, while acquisition times and dose requirements are significantly reduced compared to the 4D-STEM counterpart. [ABSTRACT FROM AUTHOR] |
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| Database: |
Academic Search Premier |
