Authors: Zagni, Nicolò, Verzellesi, Giovanni, Bertacchini, Alessandro, Borgarino, Mattia, Iucolano, Ferdinando, Chini, Alessandro

Contributors: European Project Gallium Nitride for Advanced Power Applications, Electronic Component Systems for European Leadership Joint Undertaking, European Union’s Horizon 2020 research and innovation programme, and Italy, Germany, France, Poland, Czech Republic, Netherlands

Superior Title: IEEE Electron Device Letters ; volume 45, issue 5, page 801-804 ; ISSN 0741-3106 1558-0563

Availability: https://doi.org/10.1109/led.2024.3375912
http://xplorestaging.ieee.org/ielx7/55/10509537/10466553.pdf?arnumber=10466553

Authors: Zagni, Nicolò, Fregolent, Manuel, Verzellesi, Giovanni, Marcuzzi, Alberto, De Santi, Carlo, Meneghesso, Gaudenzio, Zanoni, Enrico, Treidel, Eldad Bahat, Brusaterra, Enrico, Brunner, Frank, Hilt, Oliver, Meneghini, Matteo, Pavan, Paolo

Contributors: Electronic Component Systems for European Leadership Joint Undertaking (ECSEL JU) within the project “YESvGaN”, European Union’s Horizon 2020 Research and Innovation Programme, and Germany, France, Belgium, Austria, Sweden, Spain, and Italy

Superior Title: IEEE Transactions on Electron Devices ; volume 71, issue 3, page 1561-1566 ; ISSN 0018-9383 1557-9646

Subject Terms: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

Availability: https://doi.org/10.1109/ted.2023.3335032
http://xplorestaging.ieee.org/ielx7/16/10457976/10329308.pdf?arnumber=10329308

Authors: Zanoni, Enrico, De Santi, Carlo, Gao, Zhan, Buffolo, Matteo, Fornasier, Mirko, Saro, Marco, De Pieri, Francesco, Rampazzo, Fabiana, Meneghesso, Gaudenzio, Meneghini, Matteo, Zagni, Nicolò, Chini, Alessandro, Verzellesi, Giovanni

Contributors: Italian Ministry of University and Research, U.S. Office of Naval Research, EC Horizon 2020 ECSEL Project

Superior Title: IEEE Transactions on Electron Devices ; volume 71, issue 3, page 1396-1407 ; ISSN 0018-9383 1557-9646

Availability: https://doi.org/10.1109/ted.2023.3318564
http://xplorestaging.ieee.org/ielx7/16/10457976/10274766.pdf?arnumber=10274766

Authors: Alam, Muhammad Ashraful^Aff5, Zagni, Nicolò^Aff6, Saha, Atanu Kumar^Aff5, Thakuria, Niharika^Aff5, Thirumala, Sandeep^Aff5, Gupta, Sumeet Kumar^Aff5

Contributors: Merkle, Dieter, Managing Editor^Aff1, Rudan, Massimo, editor^Aff2, Brunetti, Rossella, editor^Aff3, Reggiani, Susanna, editor^Aff4

Superior Title: Springer Handbook of Semiconductor Devices. :931-958

Authors: Zagni, Nicolo', Fregolent, Manuel, Verzellesi, Giovanni, Marcuzzi, Alberto, Santi, Carlo De, Meneghesso, Gaudenzio, Zanoni, Enrico, Treidel, Eldad Bahat, Brusaterra, Enrico, Brunner, Frank, Hilt, Oliver, Meneghini, Matteo, Pavan, Paolo

Contributors: Zagni, Nicolo', Fregolent, Manuel, Verzellesi, Giovanni, Marcuzzi, Alberto, Santi, Carlo De, Meneghesso, Gaudenzio, Zanoni, Enrico, Treidel, Eldad Bahat, Brusaterra, Enrico, Brunner, Frank, Hilt, Oliver, Meneghini, Matteo, Pavan, Paolo

Relation: firstpage:1; lastpage:6; journal:IEEE TRANSACTIONS ON ELECTRON DEVICES; https://hdl.handle.net/11380/1327526; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85179065012

Availability: https://doi.org/10.1109/TED.2023.3335032
https://hdl.handle.net/11380/1327526

Authors: Zagni, Nicolo', Zhan, Veronica Gao, Verzellesi, Giovanni, Chini, Alessandro, Pantellini, Alessio, Natali, Marco, Lucibello, Andrea, Latessa, Luca, Lanzieri, Claudio, Santi, Carlo De, Meneghini, Matteo, Meneghesso, Gaudenzio, Zanoni, Enrico

Contributors: Zagni, Nicolo', Zhan, Veronica Gao, Verzellesi, Giovanni, Chini, Alessandro, Pantellini, Alessio, Natali, Marco, Lucibello, Andrea, Latessa, Luca, Lanzieri, Claudio, Santi, Carlo De, Meneghini, Matteo, Meneghesso, Gaudenzio, Zanoni, Enrico

Relation: volume:23; firstpage:453; lastpage:460; journal:IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY; https://hdl.handle.net/11380/1313186; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85168261146

Availability: https://doi.org/10.1109/TDMR.2023.3305033
https://hdl.handle.net/11380/1313186

Authors: Zanoni, Enrico, Santi, Carlo De, Gao, Zhan, Buffolo, Matteo, Fornasier, Mirko, Saro, Marco, Pieri, Francesco De, Rampazzo, Fabiana, Meneghesso, Gaudenzio, Meneghini, Matteo, Zagni, Nicolo', Chini, Alessandro, Verzellesi, Giovanni

Contributors: Zanoni, Enrico, Santi, Carlo De, Gao, Zhan, Buffolo, Matteo, Fornasier, Mirko, Saro, Marco, Pieri, Francesco De, Rampazzo, Fabiana, Meneghesso, Gaudenzio, Meneghini, Matteo, Zagni, Nicolo', Chini, Alessandro, Verzellesi, Giovanni

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:001087462000001; volume:71; issue:2; firstpage:1; lastpage:12; journal:IEEE TRANSACTIONS ON ELECTRON DEVICES; https://hdl.handle.net/11380/1320426; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85174808819

Availability: https://doi.org/10.1109/TED.2023.3318564
https://hdl.handle.net/11380/1320426

Authors: Chini, Alessandro, Zagni, Nicolo', Verzellesi, Giovanni, Cioni, Marcello, Giorgino, Giovanni, Nicotra, Maria Concetta, Castagna, Maria Eloisa, Iucolano, Ferdinando

Contributors: Chini, Alessandro, Zagni, Nicolo', Verzellesi, Giovanni, Cioni, Marcello, Giorgino, Giovanni, Nicotra, Maria Concetta, Castagna, Maria Eloisa, Iucolano, Ferdinando

Subject Terms: barrier trap, dynamic ON-resistance, instability, NBTI, PBTI, pGaN HEMT

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:001001401500010; volume:44; issue:6; firstpage:915; lastpage:918; journal:IEEE ELECTRON DEVICE LETTERS; https://hdl.handle.net/11380/1301366; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85153403044

Availability: https://doi.org/10.1109/LED.2023.3265503
https://hdl.handle.net/11380/1301366

Authors: Li, Jade J., Zagni, Nicola, Neilson, William D., Gray, Rebecca L., Murphy, Samuel T.

Contributors: Lancaster University, Engineering and Physical Sciences Research Council, Leverhulme Trust

Superior Title: Journal of Nuclear Materials ; volume 586, page 154656 ; ISSN 0022-3115

Subject Terms: Nuclear Energy and Engineering, General Materials Science, Nuclear and High Energy Physics

Availability: https://doi.org/10.1016/j.jnucmat.2023.154656
https://api.elsevier.com/content/article/PII:S0022311523004245?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0022311523004245?httpAccept=text/plain

Authors: Zagni, Nicolò

Superior Title: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

Availability: https://doi.org/10.1109/edtm58488.2024.10511585
http://xplorestaging.ieee.org/ielx7/10511270/10511310/10511585.pdf?arnumber=10511585

Authors: Zagni, Nicolò^{Aff1, IDs43578021004201_cor1}, Alam, Muhammad Ashraful^{Aff2, IDs43578021004201_cor2}

Superior Title: Journal of Materials Research. 36(24):4908-4918

Authors: Zagni Nicolo', Verzellesi Giovanni, Chini Alessandro

Contributors: Zagni, Nicolo', Verzellesi, Giovanni, Chini, Alessandro

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000903572900001; volume:13; issue:12; firstpage:1; lastpage:8; journal:MICROMACHINES; https://hdl.handle.net/11380/1293284; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85144603331

Availability: https://doi.org/10.3390/mi13122244
https://hdl.handle.net/11380/1293284

Authors: Zagni, Nicolò, Cioni, Marcello, Iucolano, Ferdinando, Moschetti, Maurizio, Verzellesi, Giovanni, Chini, Alessandro

Contributors: Zagni, Nicolò, Cioni, Marcello, Iucolano, Ferdinando, Moschetti, Maurizio, Verzellesi, Giovanni, Chini, Alessandro

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000731762900001; volume:37; issue:2; firstpage:1; lastpage:5; numberofpages:5; journal:SEMICONDUCTOR SCIENCE AND TECHNOLOGY; http://hdl.handle.net/11380/1256717; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85122430992

Availability: https://doi.org/10.1088/1361-6641/ac4113
http://hdl.handle.net/11380/1256717

Authors: Zagni, Nicolò, Fregolent, Manuel, Fiol, Andrea Del, Favero, Davide, Bergamin, Francesco, Verzellesi, Giovanni, Santi, Carlo De, Meneghesso, Gaudenzio, Zanoni, Enrico, Huber, Christian, Meneghini, Matteo, Pavan, Paolo

Superior Title: Journal of Semiconductors ; volume 45, issue 3, page 032501 ; ISSN 1674-4926 2058-6140

Availability: https://doi.org/10.1088/1674-4926/45/3/032501

Authors: Casini, Luca^Aff18, Delnevo, Giovanni^Aff18, Roccetti, Marco^Aff18, Zagni, Nicolò^Aff19, Cappiello, Giuseppe^Aff19

Contributors: Kacprzyk, Janusz, Series Editor^Aff1, Pal, Nikhil R., Advisory Editor^Aff2, Bello Perez, Rafael, Advisory Editor^Aff3, Corchado, Emilio S., Advisory Editor^Aff4, Hagras, Hani, Advisory Editor^Aff5, Kóczy, László T., Advisory Editor^Aff6, Kreinovich, Vladik, Advisory Editor^Aff7, Lin, Chin-Teng, Advisory Editor^Aff8, Lu, Jie, Advisory Editor^Aff9, Melin, Patricia, Advisory Editor^Aff10, Nedjah, Nadia, Advisory Editor^Aff11, Nguyen, Ngoc Thanh, Advisory Editor^Aff12, Wang, Jun, Advisory Editor^Aff13, Ahram, Tareq, editor^Aff14, Taiar, Redha, editor^Aff15, Colson, Serge, editor^Aff16, Choplin, Arnaud, editor^Aff17

Superior Title: Human Interaction and Emerging Technologies : Proceedings of the 1st International Conference on Human Interaction and Emerging Technologies (IHIET 2019), August 22-24, 2019, Nice, France. 1018:688-694

Authors: Zagni, Nicolo, Cioni, Marcello, Chini, Alessandro

Contributors: Zagni, Nicolo, Cioni, Marcello, Chini, Alessandro

Relation: info:eu-repo/semantics/altIdentifier/isbn/978-1-6654-0182-1; info:eu-repo/semantics/altIdentifier/wos/WOS:000787172500043; ispartofbook:2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA); 2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA); firstpage:231; lastpage:235; https://hdl.handle.net/11380/1257464; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85123998065

Availability: https://doi.org/10.1109/WiPDA49284.2021.9645115
https://hdl.handle.net/11380/1257464

Authors: Zagni, Nicolò^Aff1, Chini, Alessandro, Puglisi, Francesco Maria, Pavan, Paolo, Verzellesi, Giovanni

Superior Title: Journal of Computational Electronics. 19(4):1555-1563

Authors: Hong, Seongin^{Aff1, Aff7}, Zagni, Nicolò, Choo, Sooho, Liu, Na, Baek, Seungho, Bala, Arindam, Yoo, Hocheon, Kang, Byung Ha, Kim, Hyun Jae, Yun, Hyung Joong, Alam, Muhammad Ashraful^{Aff6, IDs4146702123711x_cor11}, Kim, Sunkook^{Aff1, IDs4146702123711x_cor12}

Superior Title: Nature Communications. 12(1)

Authors: Caruso, Enrico, Esseni, David, Gnani, Elena, Lizzit, Daniel, Palestri, Pierpaolo, Pin, Alessandro, Puglisi, Francesco Maria, Selmi, Luca, Zagni, Nicolò

Contributors: Caruso, Enrico, Esseni, David, Gnani, Elena, Lizzit, Daniel, Palestri, Pierpaolo, Pin, Alessandro, Puglisi, Francesco Maria, Selmi, Luca, Zagni, Nicolò

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000712450300001; volume:10; issue:20; firstpage:2472; journal:ELECTRONICS; http://hdl.handle.net/11390/1212279; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85116767222

Availability: https://doi.org/10.3390/electronics10202472
http://hdl.handle.net/11390/1212279

Authors: Cioni Marcello, Bertacchini Alessandro, Mucci Alessandro, Zagni Nicolò, Verzellesi Giovanni, Pavan Paolo, Chini Alessandro

Contributors: Cioni, Marcello, Bertacchini, Alessandro, Mucci, Alessandro, Zagni, Nicolò, Verzellesi, Giovanni, Pavan, Paolo, Chini, Alessandro

Subject Terms: On-the-fly characterization, RON drift, Silicon carbide, VTH instability

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000623367400001; volume:10; issue:4; firstpage:1; lastpage:12; journal:ELECTRONICS; http://hdl.handle.net/11380/1232775; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85100578124

Availability: https://doi.org/10.3390/electronics10040441
http://hdl.handle.net/11380/1232775