Authors: Lowney, J. R., Seiler, D. G., Thurber, W. R., Yu, Z., Song, X. N., Littler, C. L.
Superior Title: Journal of Electronic Materials. August 1993 22(8):985-991
Authors: Kim, J. S., Lowney, J. R., Thurber, W. R.
Superior Title: Narrow-gap II–VI Compounds for Optoelectronic and Electromagnetic Applications ; page 180-210 ; ISBN 9781461284215 9781461311096
Availability: https://doi.org/10.1007/978-1-4613-1109-6_6
Authors: Kang, Y.‐S., Robins, L. H., Birdwell, A. G., Shapiro, A. J., Thurber, W. R., Vaudin, M. D., Fahmi, M. M. E., Bryson, D., Mohammad, S. N.
Superior Title: physica status solidi (c) ; volume 2, issue 7, page 2800-2804 ; ISSN 1610-1634
Availability: https://doi.org/10.1002/pssc.200461492
Authors: Koenig, A. L., Ulmer, F. H., Pyke, T. N., Jr., Thurber, W. R., Bullis, W. Murray, 1930-, Center for Computer Sciences and Technology. Information Processing Technology Division., Institute for Applied Technology (U.S.). Electronic Technology Division., United States. National Bureau of Standards. Technical note.
Subject Terms: Time-sharing computer systems, Hall effect
File Description: bib
Relation: http://hdl.handle.net/2027/uiug.30112105089939; http://hdl.handle.net/2027/mdp.39015077286980
Availability:
http://hdl.handle.net/2027/uiug.30112105089939
http://hdl.handle.net/2027/mdp.39015077286980
Authors: Kang, Y.-S., Robins, L. H., Birdwell, A. G., Shapiro, A. J., Thurber, W. R., Vaudin, M. D., Fahmi, M. M. E., Bryson, D., Mohammad, S. N.
Superior Title: Physica Status Solidi (C); 2005, Vol. 2 Issue 7, p2800-2804, 5p
Authors: Sher, A. H., Thurber, W. R.
Superior Title: Journal of Applied Physics; Oct1971, Vol. 42 Issue 11, p4508-4509, 2p
Authors: Thurber, W R, Phillips, W E, Larrabee, R D
Subject Terms: 42 ENGINEERING, 36 MATERIALS SCIENCE, COMPUTER CODES, SEMICONDUCTOR DIODES, IMPURITIES, SEMICONDUCTOR MATERIALS, CARRIER LIFETIME, TRAPS, SILICON, CALIBRATION, CAPACITANCE, CRYSTAL DEFECTS, ENERGY LEVELS, FABRICATION, PERFORMANCE, PYROMETERS, RECOMBINATION, SEMICONDUCTOR DEVICES, TRANSIENTS, CRYSTAL STRUCTURE, ELECTRICAL PROPERTIES, ELEMENTS, LIFETIME, MATERIALS, MEASURING INSTRUMENTS, PHYSICAL PROPERTIES, SEMIMETALS
File Description: application/pdf
Relation: http://www.osti.gov/servlets/purl/6592610; https://www.osti.gov/biblio/6592610; https://doi.org/10.2172/6592610
Authors: THURBER, W. R., CARPENTER, B. S.
Superior Title: Chemischer Informationsdienst ; volume 9, issue 30 ; ISSN 0009-2975 2199-2924
Subject Terms: General Medicine
Availability: https://doi.org/10.1002/chin.197830366
Authors: Thurber, W. R., Bullis, W. M.
Contributors: NATIONAL BUREAU OF STANDARDS WASHINGTON DC ELECTRONIC TECHNOLOGY DIV
Superior Title: DTIC AND NTIS
Subject Terms: Solid State Physics, GALLIUM ARSENIDES, SILICON, HALL EFFECT, DOPING, NEUTRON ACTIVATION, GOLD, CHARGE CARRIERS, ELECTRICAL CONDUCTIVITY, CARRIER LIFETIME, ELECTRICAL RESISTIVITY
File Description: text/html
Availability:
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http://oai.dtic.mil/oai/oai?&verb=getRecord&metadataPrefix=html&identifier=AD0740592
Authors: Sher, A. H., Croll, W. K., Thurber, W. R.
Superior Title: Analytical Chemistry ; volume 43, issue 13, page 1831-1834 ; ISSN 0003-2700 1520-6882
Subject Terms: Analytical Chemistry
Availability: https://doi.org/10.1021/ac60307a021
Authors: Frederikse, H. P. R., Thurber, W. R., Hosler, W. R.
Superior Title: Physical Review ; volume 134, issue 2A, page A442-A445 ; ISSN 0031-899X
Subject Terms: General Physics and Astronomy
Availability: https://doi.org/10.1103/physrev.134.a442
Authors: Thurber, W. R., Mante, A. J. H.
Superior Title: Physical Review ; volume 139, issue 5A, page A1655-A1665 ; ISSN 0031-899X
Availability: https://doi.org/10.1103/physrev.139.a1655
Authors: Frederikse, H. P. R., Hosler, W. R., Thurber, W. R.
Superior Title: Physical Review ; volume 143, issue 2, page 648-651 ; ISSN 0031-899X
Subject Terms: General Physics and Astronomy
Availability: https://doi.org/10.1103/physrev.143.648