Authors: Opila, R. L., Konstadinidis, K., Marcus, M. A., Du, M.

Superior Title: First International Congress on Adhesion Science and Technology---invited papers ; page 763-771 ; ISBN 9780429087486

Availability: https://doi.org/10.1201/9780429087486-49

Authors: Cross, J. O., Opila, R. L., Boyd, I. W., Kaufmann, E. N.

Superior Title: MRS Bulletin. 40(12):1019-1034

Authors: Walker, A. V.^Aff2, Fisher, G. L.^Aff2, Hooper, A. E.^Aff3, Tighe, T.^Aff4, Opila, R. L.^Aff5, Winograd, N.^Aff4, Allara, D. L.^Aff4

Contributors: Sacher, Edward, editor^Aff1

Superior Title: Metallization of Polymers 2. :117-126

Authors: Konstadinidis, K., Opila, R. L., Taylor, J. A., Miller, A. C.

Superior Title: Adhesion International 1993 ; page 487-504

Availability: https://doi.org/10.1201/9780367813734-40

Authors: Chang, J. P., Steigerwald, M. L., Fleming, R. M., Opila, R. L., Alers, G. B.

Superior Title: MRS Online Proceedings Library. 574(1):329-334

Authors: Chang, J. P., Krautter, H. W., Zhu, W., Opila, R. L., Pai, C. S.

Superior Title: MRS Online Proceedings Library. 565(1):117-122

Authors: Sher, A., Feldman, R. D., Austin, R. F., Opila, R. L., Masaitis, R. L., Zyskind, J. L., Sulhoff, J. W.

Superior Title: Journal of Electronic Materials. June 1992 21(6):653-657

Authors: Burrows, M. Z.^{Aff1, Aff2}, Das, U. K., Bowden, S., Hegedus, S. S., Opila, R. L., Birkmire, R. W.

Superior Title: MRS Online Proceedings Library. 1066(1)

Authors: Demirkan, K., Mathew, A., Opila, R. L.

Superior Title: MRS Online Proceedings Library. 871(1)

Authors: Gross, M. E., Harriott, L. R., Opila, R. L.

Superior Title: Journal of Applied Physics ; volume 69, issue 7, page 4152-4152 ; ISSN 0021-8979 1089-7550

Subject Terms: General Physics and Astronomy

Availability: https://doi.org/10.1063/1.348978
https://pubs.aip.org/aip/jap/article-pdf/69/7/4152/8018585/4152_1_online.pdf

Authors: Demirkan, K., Mathew, A., Weiland, C., Yao, Y., Rawlett, A. M., Tour, J. M., Opila, R. L.

Superior Title: Journal of Chemical Physics; 2/21/2008, Vol. 128 Issue 7, p074705, 6p, 2 Diagrams, 5 Graphs

Subject Terms: ENERGY levels (Quantum mechanics), ORGANIC semiconductors, MOLECULAR self-assembly, MONOMOLECULAR films, PHOTOELECTRON spectroscopy, ELECTRODES

Authors: Demirkan, K., Mathew, A., Weiland, C., Reid, M., Opila, R. L.

Superior Title: Journal of Applied Physics; Feb2008, Vol. 103 Issue 3, p034505, 7p, 3 Diagrams, 8 Graphs

Subject Terms: SEMICONDUCTORS, SPECTRUM analysis, VAPOR-plating, MORPHOLOGY, ALUMINUM, POLYMERS, SURFACE chemistry

Authors: Eng Jr., J., Hubner, I. A., Barriocanal, J., Opila, R. L., Doren, D. J.

Superior Title: Journal of Applied Physics; 2/15/2004, Vol. 95 Issue 4, p1963-1968, 6p, 1 Diagram, 2 Charts, 1 Graph

Subject Terms: ELECTRON spectroscopy, NITROMETHANE, ION bombardment, BINDING energy, THIN films, TEMPERATURE

Authors: Pluchery, O., Chabal, Y. J., Opila, R. L.

Superior Title: Journal of Applied Physics; 8/15/2003, Vol. 94 Issue 4, p2707-2715, 9p, 1 Diagram, 8 Graphs

Subject Terms: SEMICONDUCTORS, OPTOELECTRONIC devices, OXIDATION, PHOTOELECTRON spectroscopy

Authors: Chu, K., Chang, J. P., Steigerwald, M. L., Fleming, R. M., Opila, R. L., Lang, D. V., Van Dover, R. B., Jones, C. D. W.

Superior Title: Journal of Applied Physics; 1/1/2002, Vol. 91 Issue 1, p308, 9p, 1 Black and White Photograph, 1 Diagram, 2 Charts, 6 Graphs

Subject Terms: THIN films, CARBON, CARBONATES, SPUTTERING (Physics)

Authors: Chang, J. P., Green, M. L., Donnelly, V. M., Opila, R. L., Eng, J., Sapjeta, J., Silverman, P. J., Weir, B., Lu, H. C., Gustafsson, T., Garfunkel, E.

Superior Title: Journal of Applied Physics; 5/1/2000, Vol. 87 Issue 9, p4449, 7p, 1 Diagram, 2 Charts, 7 Graphs

Subject Terms: PHOTOELECTRON spectroscopy, THIN films, NITROGEN, MASS spectrometry, SILICON

Authors: Copuroglu, M., Sezen, H., Opila, R. L., Suzer, S.

Superior Title: ACS Applied Materials and Interfaces

Subject Terms: Band-bending, Buried Interface, Photovoltage, Xps, Doping

File Description: application/pdf

Relation: http://dx.doi.org/10.1021/am401696e; Çopuroğlu, M., Sezen, H., Opila, R. L., & Suzer, S. (2013). Band-bending at buried SiO2/Si interface as probed by XPS. ACS applied materials & interfaces, 5(12), 5875-5881.; http://hdl.handle.net/11693/11354

Availability: https://doi.org/10.1021/am401696e
http://hdl.handle.net/11693/11354

Authors: Church, J. R., Weiland, C., Opila, R. L.

Superior Title: Applied Physics Letters ; volume 106, issue 17 ; ISSN 0003-6951 1077-3118

Subject Terms: Physics and Astronomy (miscellaneous)

Availability: https://doi.org/10.1063/1.4919448

Authors: Du, M., Opila, R. L.

Superior Title: Journal of Applied Physics. 2/1/1999, Vol. 85 Issue 3, p1496. 7p. 1 Black and White Photograph, 1 Chart, 7 Graphs.

Subject Terms: *COPPER diffusion rate, *PHOTOELECTRON spectroscopy, *DIELECTRICS

Authors: Comizzoli, R. B., Opila, R. L.

Superior Title: Journal of Applied Physics. 1/1/1987, Vol. 61 Issue 1, p261. 10p. 2 Black and White Photographs, 3 Diagrams, 10 Graphs.

Subject Terms: *POLYCRYSTALLINE semiconductors, *ELECTRON beams, *VACUUM technology