Showing 1 - 20 results of 20 for search 'Moazzami, K.' Narrow Search
12
Academic Journal

Contributors: Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, MI 48109-2122, USA, Department of Electrical Engineering, University at Buffalo, The State University of New York, Buffalo, NY 14260, USA, Ann Arbor

Subject Terms: Physics, Science

File Description: 3118 bytes; 235117 bytes; text/plain; application/pdf

Relation: Moazzami, K; Murphy, T E; Phillips, J D; Cheung, M C-K; Cartwright, A N (2006). "Sub-bandgap photoconductivity in ZnO epilayers and extraction of trap density spectra." Semiconductor Science and Technology. 21(6): 717-723.; https://hdl.handle.net/2027.42/48934; http://dx.doi.org/10.1088/0268-1242/21/6/001; Semiconductor Science and Technology.

14
Academic Journal

Contributors: Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, Michigan 48109-2122, Rockwell Scientific Company, Camarillo, California 93012

Subject Terms: Physics, Science

File Description: 3102 bytes; 374813 bytes; text/plain; application/pdf

Relation: Phillips, J. D.; Moazzami, K.; Kim, J.; Edwall, D. D.; Lee, D. L.; Arias, J. M. (2003). "Uniformity of optical absorption in HgCdTe epilayer measured by infrared spectromicroscopy." Applied Physics Letters 83(18): 3701-3703.; https://hdl.handle.net/2027.42/69699; Applied Physics Letters; M. A. Kinch, J. Electron. Mater. JECMA529, 809 (2000).; A. Rogalski, Infrared Phys. Technol. IPTEEY40, 279 (1999).; J. Baars, Opt. Mater. OMATET6, 41 (1996).; J. Phillips, J. Appl. Phys. JAPIAU91, 4590 (2002).; M. W. Muller and A. Sher, Appl. Phys. Lett. APPLAB74, 2343 (1999).; J. Phillips, D. Edwall, L. Don, and J. Arias, J. Vac. Sci. Technol. B JVTBD919, 1580 (2001).; D. Edwall, J. Phillips, D. Lee, and J. Arias, J. Electron. Mater. JECMA530, 643 (2001).; G. L. Hansen, J. L. Schmit, and T. N. Casselman, J. Appl. Phys. JAPIAU53, 7099 (1982).; S. L. Price and P. R. Boyd, Semicond. Sci. Technol. SSTEET8, 842 (1993).; G. M. Williams and R. E. DeWames, J. Electron. Mater. JECMA524, 1239 (1995).