Authors: Kopanski, J. J.^Aff3

Contributors: Kalinin, Sergei, editor^Aff1, Gruverman, Alexei, editor^Aff2

Superior Title: Scanning Probe Microscopy : Electrical and Electromechanical Phenomena at the Nanoscale. :88-112

Authors: Kopanski, J. J.

Superior Title: MRS Online Proceedings Library. 838(1):217-228

Authors: Kopanski, J. J., Marchiando, J. F., Albers, J., Rennex, B. G.

Superior Title: The 1998 international conference on characterization and metrology for ULSI technology

Availability: https://doi.org/10.1063/1.56858

Authors: Mayo, S., Kopanski, J. J., Guthrie, W. F.

Superior Title: The 1998 international conference on characterization and metrology for ULSI technology

Availability: https://doi.org/10.1063/1.56912

Authors: Gajewski, D. A.^{Aff133, Aff233, Aff333}, Guyer, J. E., Kopanski, J. J.^{Aff133, Aff233}, Pellegrino, J. G.^{Aff133, Aff233}

Superior Title: MRS Online Proceedings Library. 618(1)

Authors: Seiler, D G, Lowney, J R, Thurber, W R, Kopanski, J J, Harman, G G

Availability: https://doi.org/10.6028/nist.sp.400-94

Authors: Huber, H. P., Humer, I., Hochleitner, M., Fenner, M., Moertelmaier, M., Rankl, C., Imtiaz, A., Wallis, T. M., Tanbakuchi, H., Hinterdorfer, P., Kabos, P., Smoliner, J., Kopanski, J. J., Kienberger, F.

Superior Title: Journal of Applied Physics; Jan2012, Vol. 111 Issue 1, p014301, 9p, 1 Color Photograph, 6 Graphs

Subject Terms: MICROWAVES, MICROSCOPY, DOPING agents (Chemistry), OXIDES, METAL oxide semiconductors, CHARGE carrier capture, SCATTERING (Physics)

Authors: Buh, G. H.¹, Kopanski, J. J.¹, Marchiando, J. F.¹, Birdwell, A. G.¹, Kuk, Y.²

Superior Title: Journal of Applied Physics. 8/15/2003, Vol. 94 Issue 4, p2680-2685. 6p. 6 Graphs.

Subject Terms: *MICROSCOPY, *SEMICONDUCTORS, *ATOMIC force microscopy, *ELECTRONIC amplifiers

Authors: Marchiando, J. F., Kopanski, J. J.

Superior Title: Journal of Applied Physics. 11/15/2002, Vol. 92 Issue 10, p5798. 12p. 1 Diagram, 14 Graphs.

Subject Terms: *SEMICONDUCTOR doping, *MICROSCOPY

Authors: Wallis, T. M., Imtiaz, A., Curtin, A. E., Kabos, P., Kopanski, J. J., Huber, H.-P., Kienberger, F.

Superior Title: 2012 Conference on Precision electromagnetic Measurements

Availability: https://doi.org/10.1109/cpem.2012.6251036
http://xplorestaging.ieee.org/ielx5/6241752/6250621/06251036.pdf?arnumber=6251036

Authors: Ryan, J. T., Yu, L. C., Han, J. H., Kopanski, J. J, Cheung, K. P., Zhang, F., Wang, C., Campbell, J. P., Suehle, J. S., Tilak, V., Fronheiser, J.

Superior Title: Proceedings of 2011 International Symposium on VLSI Technology, Systems and Applications

Availability: https://doi.org/10.1109/vtsa.2011.5872242
http://xplorestaging.ieee.org/ielx5/5779880/5872202/05872242.pdf?arnumber=5872242

Authors: Kopanski, J. J., Afridi, M. Y., Jeliazkov, S., Jiang, W., Walker, T. R., Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, Erik M.

Superior Title: AIP Conference Proceedings ; ISSN 0094-243X

Availability: https://doi.org/10.1063/1.2799430

Authors: Yang, J., Kopanski, J. J., Postula, A., Bialkowski, M.

Subject Terms: 2208 Electrical and Electronic Engineering, 2213 Safety, Risk, Reliability and Quality, 2504 Electronic, Optical and Magnetic Materials, 2508 Surfaces, Coatings and Films, 3104 Condensed Matter Physics, 3107 Atomic and Molecular Physics, and Optics

Availability: https://doi.org/10.1016/j.microrel.2004.11.030
https://espace.library.uq.edu.au/view/UQ:712810

Authors: Ryan, J. T., Yu, L. C., Han, J. H., Kopanski, J. J., Cheung, K. P., Zhang, F., Wang, C., Campbell, J. P., Suehle, J. S.

Superior Title: Applied Physics Letters ; volume 98, issue 23 ; ISSN 0003-6951 1077-3118

Availability: https://doi.org/10.1063/1.3597298

Authors: Sohn, Daewon, Moon, Hyoseung, Fasolka, Michael J., Eidelman, Naomi, Koo, Sang-Mo, Richter, Curt A., Park, SeungEun, Kopanski, J. J., Amis, Eric

Superior Title: Chemistry Letters ; volume 36, issue 10, page 1210-1211 ; ISSN 0366-7022 1348-0715

Subject Terms: General Chemistry

Availability: https://doi.org/10.1246/cl.2007.1210

Authors: Yang, J., Kopanski, J. J., Postula, A., Bialkowski, M.

Contributors: H. Q. Lam

Subject Terms: Physics, Applied, Silicon, Spectroscopy, Resolution, Devices, 290902 Integrated Circuits, C1, 671499 Instrumentation not elsewhere classified

Availability: https://doi.org/10.1063/1.1922077
https://espace.library.uq.edu.au/view/UQ:77456/UQ77456_OA.pdf
https://espace.library.uq.edu.au/view/UQ:77456

Authors: Buh, G. H., Kopanski, J. J.

Superior Title: Applied Physics Letters ; volume 83, issue 12, page 2486-2488 ; ISSN 0003-6951 1077-3118

Subject Terms: Physics and Astronomy (miscellaneous)

Availability: https://doi.org/10.1063/1.1613800
https://pubs.aip.org/aip/apl/article-pdf/83/12/2486/10199778/2486_1_online.pdf

Authors: Kopanski, J. J., Avila, R. E.

Superior Title: Springer Proceedings in Physics ; Amorphous and Crystalline Silicon Carbide III ; page 119-124 ; ISSN 0930-8989 1867-4941

Availability: https://doi.org/10.1007/978-3-642-84402-7_18

Authors: Avila, R. E., Kopanski, J. J., Fung, C. D.

Superior Title: Journal of Applied Physics. 10/15/1987, Vol. 62 Issue 8, p3469. 3p. 2 Graphs.

Subject Terms: *SILICON carbide, *DIODES, *ION implantation

Authors: Kopanski, J. J., Mayo, S.

Superior Title: Applied Physics Letters ; volume 72, issue 19, page 2469-2471 ; ISSN 0003-6951 1077-3118

Subject Terms: Physics and Astronomy (miscellaneous)

Availability: https://doi.org/10.1063/1.121397
https://pubs.aip.org/aip/apl/article-pdf/72/19/2469/7807766/2469_1_online.pdf