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Academic Journal

Subject Terms: Physics

Relation: Umesh, S.B. and Joshi, G.R. and Bhat, B.R. and Ravindra, M. and Kulkarni, S.R. and Damle, R. (2004) Heavy ion testing of VLSI devices for single event effects. Journal of Spacecraft Technology, 14 (1). pp. 48-53. ISSN 0971-1600

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11
Academic Journal

Superior Title: Communications in Statistics: Theory & Methods; Jan1986, Vol. 15 Issue 8, p2375-2382, 8p

12
Academic Journal

Superior Title: Communications in Statistics: Theory & Methods; Jan1986, Vol. 15 Issue 6, p1751-1771, 21p

14
Periodical

Authors: Bhat, B.R.

Superior Title: Journal of Applied Probability; August 1969, Vol. 6 Issue: 2 p309-318, 10p

17
Conference

Superior Title: 2009 Conference on Lasers & Electro Optics & the Pacific Rim Conference on Lasers & Electro-Optics; 2009, p1-2, 2p