Authors: Zhuang, Houlong1 (AUTHOR), Yu, Zhenzhen2 (AUTHOR), Li, Lin1 (AUTHOR), Wang, Yun-Jiang3,4 (AUTHOR), Béland, Laurent Karim5 (AUTHOR)
Superior Title: Journal of Applied Physics. 1/7/2024, Vol. 135 Issue 1, p1-3. 3p.
Subject Terms: *THERMODYNAMICS, *ATOM-probe tomography, *ELECTROMAGNETIC wave absorption, *IMPACT response, *KIRKENDALL effect
Authors: Dasari, Sriswaroop1 (AUTHOR) sriswaroop.dasari@unt.edu, Sharma, Abhishek1 (AUTHOR), Gorsse, Stéphane2 (AUTHOR), Chesetti, Advika1 (AUTHOR), Banerjee, Rajarshi1 (AUTHOR) raj.banerjee@unt.edu
Superior Title: Journal of Applied Physics. 7/7/2023, Vol. 134 Issue 1, p1-10. 10p.
Subject Terms: *FACE centered cubic structure, *ATOM-probe tomography, *NUCLEATION, *HETEROGENOUS nucleation, *ENTROPY, *PHASE transitions, *ALLOYS
Authors: Wilkins, Alex (AUTHOR)
Superior Title: New Scientist. 1/6/2024, Vol. 261 Issue 3472, p17-17. 1/4p.
Subject Terms: *ATOM-probe tomography, *METALLIC glasses, *COPPER-zirconium alloys, *NANOTUBES
Authors: Kumar, Ashutosh1 (AUTHOR), Yi, Wei1 (AUTHOR), Ohkubo, Tadakatsu1 (AUTHOR) OHKUBO.Tadakatsu@nims.go.jp, Chen, Jun1 (AUTHOR), Sekiguchi, Takashi1 (AUTHOR), Tanaka, Ryo2 (AUTHOR), Takashima, Shinya2 (AUTHOR), Edo, Masaharu2 (AUTHOR), Hono, Kazuhiro1 (AUTHOR)
Superior Title: Journal of Applied Physics. May2023, Vol. 133 Issue 18, p1-9. 9p.
Subject Terms: *ATOM-probe tomography, *SCANNING transmission electron microscopy, *GALLIUM nitride, *ION implantation
Authors: Zeisl, Stefan1 (AUTHOR) stefan.zeisl@unileoben.ac.at, Van Steenberge, Nele2 (AUTHOR), Schnitzer, Ronald1 (AUTHOR)
Superior Title: Journal of Materials Science. Apr2023, Vol. 58 Issue 16, p7149-7160. 12p. 1 Color Photograph, 2 Charts, 8 Graphs.
Subject Terms: *MARAGING steel, *ATOM-probe tomography, *PRECIPITATION (Chemistry), *HEAT treatment
Authors: Bai, Guangzhu1,2 (AUTHOR) guangzhubai@sxnu.edu.cn, Zhang, Yongjian2 (AUTHOR), Shi, Wei3 (AUTHOR), Wang, Xianhao3 (AUTHOR), Zhu, Huihui2 (AUTHOR), Wang, Fang1 (AUTHOR), Zhang, Hailong1,2 (AUTHOR) hlzhang@ustb.edu.cn
Superior Title: Ceramics International. Apr2024, Vol. 50 Issue 8, p12915-12923. 9p.
Subject Terms: *ATOM-probe tomography, *COPPER, *TRANSMISSION electron microscopy, *THERMAL conductivity, *ALLOYS
Authors: Mitchell, J. W.1 (AUTHOR), Greenhill, C. M.2 (AUTHOR), Huang, T.-Y.2 (AUTHOR), Jen, T.2 (AUTHOR), Yang, Y.-C.2 (AUTHOR), Hammond, K.2 (AUTHOR), Heyman, J. N.3 (AUTHOR), Goldman, R. S.1,2 (AUTHOR) rsgold@umich.edu
Superior Title: Applied Physics Letters. 4/8/2024, Vol. 124 Issue 15, p1-6. 6p.
Subject Terms: *ATOM-probe tomography, *ALLOYS, *CHARGE carrier mobility, *PHOTOCONDUCTIVITY, *TERAHERTZ materials
Authors: Su, Wentao1,2 (AUTHOR), Chen, Lei1,2 (AUTHOR) chenleihit@hit.edu.cn, Huo, Sijia1,2 (AUTHOR) huosijia@hit.edu.cn, Zhang, Wen1,2 (AUTHOR), Wang, Yujin1,2 (AUTHOR), Zhou, Yu1,2 (AUTHOR)
Superior Title: Journal of the European Ceramic Society. Apr2024, Vol. 44 Issue 4, p1881-1889. 9p.
Subject Terms: *CRYSTAL grain boundaries, *ATOM-probe tomography, *CERAMICS, *NANOINDENTATION tests, *FRACTURE toughness, *CARBIDES
Authors: Dubosq, Renelle1 (AUTHOR) renelle.dubosq@gmail.com, Camacho, Alfredo2 (AUTHOR), Rogowitz, Anna3,4 (AUTHOR), Zhang, Siyuan1 (AUTHOR), Gault, Baptiste1,5 (AUTHOR)
Superior Title: Journal of Metamorphic Geology. Apr2024, Vol. 42 Issue 3, p355-372. 18p.
Subject Terms: *GARNET, *ATOM-probe tomography, *ROCK-forming minerals, *KIRKENDALL effect, *OROGENIC belts, *CRYSTAL grain boundaries
Geographic Terms: AUSTRALIA
Authors: Xie, Zhuojun1 (AUTHOR) xiezhuojun@mail.gyig.ac.cn, Gopon, Phillip2,3 (AUTHOR) phillip.gopon@unileoben.ac.at, Xia, Yong1 (AUTHOR), Douglas, James O.3,4 (AUTHOR), Cline, Jean5 (AUTHOR), Liu, Jianzhong6,7 (AUTHOR), Tan, Qinping1 (AUTHOR), Xiao, Jingdan1,8 (AUTHOR), Wen, Yuanyun9 (AUTHOR), Chen, Youwei1 (AUTHOR), Li, Pan10 (AUTHOR), Moody, Michael P.3 (AUTHOR)
Superior Title: Mineralium Deposita. Apr2024, Vol. 59 Issue 4, p757-772. 16p.
Subject Terms: *ATOM-probe tomography, *GOLD
Geographic Terms: GUIZHOU Sheng (China), NEVADA, CHINA
Authors: Wilkins, Alex (AUTHOR)
Superior Title: New Scientist. 10/28/2023, Vol. 260 Issue 3462, p11-11. 1/3p.
Subject Terms: *ATOM-probe tomography, *EARTH (Planet), *SOLAR system
Authors: Knipling, K.1 (AUTHOR) keith.knipling@nrl.navy.mil, Narayana, P.2 (AUTHOR), Nguyen, L.3 (AUTHOR), Beaudry, D.4 (AUTHOR)
Superior Title: Journal of Applied Physics. 3/14/2023, Vol. 133 Issue 10, p1-8. 8p.
Subject Terms: *ATOM-probe tomography, *LAVES phases (Metallurgy), *MICROSTRUCTURE, *ELASTIC modulus, *SCANNING electron microscopy, *ALLOYS
Authors: Kulkarni, Anup1 (AUTHOR), Srinivasan, Dheepa1 (AUTHOR), Kumar, Saurabh1,2 (AUTHOR), Kumar, Praveen2 (AUTHOR), Jayaram, Vikram2 (AUTHOR) qjayaram@iisc.ac.in
Superior Title: Journal of Materials Science. Feb2023, Vol. 58 Issue 5, p2310-2333. 24p. 5 Color Photographs, 1 Black and White Photograph, 3 Diagrams, 8 Charts, 7 Graphs.
Subject Terms: *THERMAL stability, *ATOM-probe tomography, *TRANSMISSION electron microscopy, *HEAT treatment, *COPPER
Authors: Guo, Tingwei1 (AUTHOR), Hu, Yixuan1 (AUTHOR), Lahkar, Simanta1 (AUTHOR), Joardar, Joydip2 (AUTHOR), Chen, Mingwei3 (AUTHOR), Reddy, Kolan Madhav1 (AUTHOR) kmreddy@sjtu.edu.cn
Superior Title: Journal of the European Ceramic Society. Aug2024, Vol. 44 Issue 10, p5590-5600. 11p.
Subject Terms: *BORON carbides, *ATOM-probe tomography, *X-ray photoelectron spectroscopy, *BULK modulus, *SINTERING
Authors: Diagne, Aissatou1 (AUTHOR), Garcia, Luis Gonzalez1 (AUTHOR), Ndiaye, Samba1 (AUTHOR), Gogneau, Noëlle2 (AUTHOR), Vrellou, Maria3 (AUTHOR), Houard, Jonathan1 (AUTHOR), Rigutti, Lorenzo1 (AUTHOR) lorenzo.rigutti@univ-rouen.fr
Superior Title: Journal of Microscopy. Mar2024, Vol. 293 Issue 3, p153-159. 7p.
Subject Terms: *ATOM-probe tomography, *IONS, *HYDRIDES, *SEMICONDUCTORS, *HYDROGEN analysis
Authors: Daradkeh, Samer I.1,2,3 (AUTHOR) 252679@vutbr.cz, Recalde, Oscar4 (AUTHOR), Mousa, Marwan S.5 (AUTHOR), Sobola, Dinara3,6 (AUTHOR), Boll, Torben2,7 (AUTHOR)
Superior Title: High Temperature Corrosion of Materials. Feb2024, Vol. 101 Issue 1, p41-59. 19p.
Subject Terms: *CRYSTAL grain boundaries, *ATOM-probe tomography, *KIRKENDALL effect, *ALLOYS, *TRANSMISSION electron microscopy, *METALLIC oxides, *METALLIC glasses
Authors: Garcia, Jacob M.1 jacob.garcia@nist.gov, Chiaramonti, Ann N.1
Superior Title: Electronic Device Failure Analysis. Feb2024, Vol. 26 Issue 1, p14-21. 7p.
Authors: Rogozhkin, Sergey V.1,2 (AUTHOR) kav052@campus.mephi.ru, Klauz, Artem V.1,2 (AUTHOR) nikitin@itep.ru, Ke, Yubin3 (AUTHOR) keyb@ihep.ac.cn, Almásy, László4 (AUTHOR), Nikitin, Alexander A.1,2 (AUTHOR) artem.khomich@gmail.com, Khomich, Artem A.1,2 (AUTHOR) bogachev@itep.ru, Bogachev, Aleksei A.1,2 (AUTHOR), Gorshkova, Yulia E.5,6 (AUTHOR) yulia.gorshkova@jinr.ru, Bokuchava, Gizo D.5 (AUTHOR) gizo@nf.jinr.ru, Kopitsa, Gennadiy P.7 (AUTHOR) kopitsa@lns.pnpi.spb.ru, Sun, Liying8 (AUTHOR) sunliying@gdinm.com
Superior Title: Nanomaterials (2079-4991). Jan2024, Vol. 14 Issue 2, p194. 16p.
Authors: Bubenov, S. S.1 (AUTHOR) s.bubenov@gmail.com, Dorofeev, S. G.1 (AUTHOR)
Superior Title: Doklady Chemistry. Jan2024, Vol. 514 Issue 1, p1-20. 20p.
Subject Terms: *ATOM-probe tomography, *SILICON crystals, *CHEMICAL vapor deposition, *SILICON, *SILICON compounds
Superior Title: Microscopy Today. Jan2024, Vol. 32 Issue 1, p61-64. 4p.
Subject Terms: *ATOM-probe tomography