Showing 1 - 1 results of 1 for search '"EG: X L"' Narrow Search
Search Tools: Email this Search — Save search to account
1
Academic Journal
Testing for Intermittent Faults in Digital Circuits.

Authors: Breuer, M.A.

Superior Title: IEEE Transactions on Computers; 1973, Vol. C-22 Issue 3, p241-246, 6p

Zugang prüfen (DOI)

Save to List