Authors: Li, Min¹ (AUTHOR), Zhou, Boya² (AUTHOR), Zhang, Menghan¹ (AUTHOR), Gu, Wei³ (AUTHOR) wei_gu@zuel.edu.cn

Superior Title: Journal of Difference Equations & Applications. Mar2024, Vol. 30 Issue 3, p361-376. 16p.

Subject Terms: *FINITE difference method, *MOLECULAR beam epitaxy

Authors: He, Zhihao¹ (AUTHOR), To, Yick On¹ (AUTHOR), Ma, Chen¹ (AUTHOR), Wang, Jiannong^1,2 (AUTHOR), Sou, Iam Keong^1,2 (AUTHOR) phiksou@ust.hk

Superior Title: AIP Advances. Mar2024, Vol. 14 Issue 3, p1-7. 7p.

Subject Terms: *MOLECULAR beam epitaxy, *ATOMIC force microscopy, *THIN films, *DIFFRACTION patterns, *ELECTRON diffraction, *X-ray diffraction

Authors: Chen, Xuyang^1,2 (AUTHOR) chenxy.2018@tsinghua.org.cn, Li, Guangchao² (AUTHOR), Lin, Feng¹ (AUTHOR) linfeng@tsinghua.edu.cn

Superior Title: AIP Advances. Mar2024, Vol. 14 Issue 3, p1-12. 12p.

Subject Terms: *MOLECULAR beam epitaxy, *THIN films, *STRESS concentration, *TWO-dimensional models, *MATHEMATICAL models

Authors: Yao, Lin^1,2 (AUTHOR) yaolin1023@mail.ustc.edu.cn, Xia, Yinhua¹ (AUTHOR) yhxia@ustc.edu.cn, Xu, Yan¹ (AUTHOR) yxu@ustc.edu.cn

Superior Title: Applied Numerical Mathematics. Mar2024, Vol. 197, p288-306. 19p.

Subject Terms: *MOLECULAR beam epitaxy, *CRANK-nicolson method, *LINEAR operators, *EXTRAPOLATION

Authors: Nallasani, Umeshwar Reddy¹ (AUTHOR), Wu, Ssu-Kuan¹ (AUTHOR), Diep, Nhu Quynh¹ (AUTHOR), Lin, Yen-Yu¹ (AUTHOR), Wen, Hua-Chiang¹ (AUTHOR), Chou, Wu-Ching¹ (AUTHOR) wcchou957@nycu.edu.tw, Chia, Chin-Hau² (AUTHOR)

Superior Title: Scientific Reports. 3/1/2024, Vol. 14 Issue 1, p1-9. 9p.

Subject Terms: *MOLECULAR beam epitaxy, *SURFACE analysis, *HETEROSTRUCTURES, *EPITAXY, *LATTICE constants

Authors: Zhong, Tingting¹ (AUTHOR) 20213085400009@hainnu.edu.cn, Zeng, Lina^1,2,3 (AUTHOR) jilinchangchun@yeah.net, Yang, Junfeng¹ (AUTHOR) 20212070200004@hainnu.edu.cn, Shu, Yichao¹ (AUTHOR) 20213085400001@hainnu.edu.cn, Sun, Li^1,2,3 (AUTHOR) lisun_2014@163.com, Li, Zaijin^1,2,3 (AUTHOR) lizaijin@hainnu.edu.cn, Chen, Hao^1,2 (AUTHOR) 15948713468@163.com, Liu, Guojun^1,2,3 (AUTHOR) 068006@hainnu.edu.cn, Qiao, Zhongliang^1,2,3 (AUTHOR) qzhl060910@hainnu.edu.cn, Qu, Yi^1,2,3 (AUTHOR) quyi@hainnu.edu.cn, Xu, Dongxin² (AUTHOR), Li, Lianhe³ (AUTHOR), Li, Lin^1,2,3 (AUTHOR) lin.li@hainnu.edu.cn

Superior Title: Materials (1996-1944). Mar2024, Vol. 17 Issue 5, p1090. 14p.

Subject Terms: *THIN films, *MOLECULAR beam epitaxy, *Q-switched lasers, *SILICON films, *SCANNING electron microscopes, *ELECTRON beams, *ION beams

Authors: Xie, Sen^1,2 (AUTHOR), Liu, Keke¹ (AUTHOR), Li, Chunxia^1,2 (AUTHOR), Yan, Fan¹ (AUTHOR), Ouyang, Yujie^1,2 (AUTHOR), Ge, Haoran¹ (AUTHOR), Li, Xianda^1,2 (AUTHOR), Su, Xianli¹ (AUTHOR), Liu, Yong³ (AUTHOR), Liu, Wei¹ (AUTHOR) w.liu@whut.edu.cn, Tang, Xinfeng¹ (AUTHOR) tangxf@whut.edu.cn

Superior Title: Applied Physics Letters. 2/26/2024, Vol. 124 Issue 9, p1-7. 7p.

Subject Terms: *THERMOELECTRIC materials, *MOLECULAR beam epitaxy, *PHOTOELECTRON spectroscopy, *FERMI surfaces, *TUNNELING spectroscopy, *TRANSITION temperature

Authors: Strohbeen, Patrick J.¹ (AUTHOR), Banerjee, Tathagata² (AUTHOR), Brook, Aurelia M.¹ (AUTHOR), Levy, Ido¹ (AUTHOR), Sarney, Wendy L.³ (AUTHOR), van Dijk, Jechiel¹ (AUTHOR), Orth, Hayden¹ (AUTHOR), Mikalsen, Melissa¹ (AUTHOR), Fatemi, Valla² (AUTHOR), Shabani, Javad¹ (AUTHOR) jshabani@nyu.edu

Superior Title: Applied Physics Letters. 2/26/2024, Vol. 124 Issue 9, p1-5. 5p.

Subject Terms: *MOLECULAR beam epitaxy, *TANTALUM, *HYBRID materials, *TANTALUM films, *ATOMIC force microscopy, *INTERFACIAL roughness

Authors: Yan, Pengfei¹ (AUTHOR), Xu, Yongkang¹ (AUTHOR), Wang, Jin¹ (AUTHOR), Zhang, Xiaolong¹ (AUTHOR), Dai, Xingze¹ (AUTHOR), Wang, Chao^2,3 (AUTHOR), He, Liang¹ (AUTHOR) heliang@nju.edu.cn

Superior Title: Applied Physics Letters. 2/5/2024, Vol. 124 Issue 6, p1-7. 7p.

Subject Terms: *MOLECULAR beam epitaxy, *THIN films, *FERROMAGNETISM, *MONOMOLECULAR films, *AUDITING standards, *GALLIUM antimonide

Authors: Khan, Md Irfan¹ (AUTHOR) mdirfan@umich.edu, Lee, Cindy² (AUTHOR), Ahmadi, Elaheh^1,3 (AUTHOR)

Superior Title: Applied Physics Letters. 2/5/2024, Vol. 124 Issue 6, p1-6. 6p.

Subject Terms: *MOLECULAR beam epitaxy, *SECONDARY ion mass spectrometry, *LOW temperatures, *NANOWIRES, *HIGH temperatures

Authors: Cheng, Yuanbo¹ (AUTHOR), Zuo, Zongyan² (AUTHOR), Yao, Jinshan¹ (AUTHOR), Zhang, Kedong¹ (AUTHOR), Lu, Yang³ (AUTHOR), Li, Chen^1,4 (AUTHOR), Deng, Yu^1,4 (AUTHOR), Zhang, Xuejin^1,4 (AUTHOR) xuejinzh@nju.edu.cn, Lu, Hong^1,4 (AUTHOR) hlu@nju.edu.cn, Chen, Yan‐Feng¹ (AUTHOR)

Superior Title: Advanced Optical Materials. 2/2/2024, Vol. 12 Issue 4, p1-7. 7p.

Subject Terms: *MOLECULAR beam epitaxy, *PHOTOLUMINESCENCE, *AUDITING standards, *OPTOELECTRONIC devices, *GALLIUM arsenide, *OPTICAL pumping

Authors: Nishihaya, Shinichi¹ (AUTHOR), Nakamura, Ayano¹ (AUTHOR), Ohno, Mizuki² (AUTHOR), Kriener, Markus³ (AUTHOR), Watanabe, Yuto¹ (AUTHOR), Kawasaki, Masashi^2,3 (AUTHOR), Uchida, Masaki¹ (AUTHOR) m.uchida@phys.titech.ac.jp

Superior Title: Applied Physics Letters. 1/8/2024, Vol. 124 Issue 2, p1-5. 5p.

Subject Terms: *CARRIER density, *MOLECULAR beam epitaxy, *TRANSPORT planes, *DENSITY, *LOW temperatures

Authors: Jiang, Chen¹ (AUTHOR), Liu, Hao¹ (AUTHOR) hliu@bupt.edu.cn, Liu, Zhuoliang¹ (AUTHOR), Ye, Jihong¹ (AUTHOR), Zhai, Hao¹ (AUTHOR), Liu, Shuaicheng¹ (AUTHOR), Lin, Jiacheng¹ (AUTHOR), Wang, Qi¹ (AUTHOR), Ren, Xiaomin¹ (AUTHOR)

Superior Title: Applied Physics A: Materials Science & Processing. Jan2024, Vol. 130 Issue 1, p1-8. 8p.

Subject Terms: *MOLECULAR beam epitaxy, *THERMOCYCLING, *AUDITING standards, *GALLIUM arsenide, *LIGHT sources, *SEMICONDUCTOR lasers

Authors: Reza, Md. Shamim, Dey, Tuhin, Arbogast, Augustus W., Muhowski, Aaron J., Holtz, Mark W., Stephenson, Chad A., Bank, Seth R., Wasserman, Daniel, Wistey, Mark A.

Superior Title: Journal of Applied Physics; 11/14/2023, Vol. 134 Issue 18, p1-7, 7p

Subject Terms: GERMANIUM alloys, MOLECULAR beam epitaxy, AMORPHOUS carbon, RAMAN spectroscopy, CARBON

Authors: Nakagawa, Ryusuke, Watanabe, Rikuta, Miyashita, Naoya, Yamaguchi, Koichi

Superior Title: Journal of Applied Physics; 10/21/2023, Vol. 134 Issue 15, p1-7, 7p

Subject Terms: NANOWIRES, SILICON nanowires, MOLECULAR beam epitaxy, ELECTRON beams, X-ray photoelectron spectroscopy, ATOMIC force microscopy, TRANSMISSION electron microscopy

Authors: Brito, Daniel^1,2 (AUTHOR), Pérez-Rodriguez, Ana³ (AUTHOR), Khatri, Ishwor¹ (AUTHOR), Tavares, Carlos José⁴ (AUTHOR), Amado, Mario³ (AUTHOR), Castro, Eduardo⁵ (AUTHOR), Diez, Enrique³ (AUTHOR), Sadewasser, Sascha^1,6 (AUTHOR), Claro, Marcel S.^1,6 (AUTHOR) marcel.claro@inl.int

Superior Title: Journal of Applied Physics. 9/21/2022, Vol. 132 Issue 11, p1-10. 10p.

Subject Terms: *MOLECULAR beam epitaxy, *TOPOLOGICAL insulators, *TOPOLOGICAL property, *SEMIMETALS, *CARRIER density, *MAGNETORESISTANCE, *SURFACE states

Authors: Nevinskas, I.¹ (AUTHOR) ignas.nevinskas@ftmc.lt, Stanionytė, S.¹ (AUTHOR), Devenson, J.¹ (AUTHOR), Krotkus, A.¹ (AUTHOR)

Superior Title: Journal of Applied Physics. 8/7/2022, Vol. 132 Issue 5, p1-6. 6p.

Subject Terms: *SUBMILLIMETER waves, *MOLECULAR beam epitaxy, *BISMUTH, *ELECTRON scattering, *TERAHERTZ spectroscopy, *THIN films, *ENERGY bands, *FEMTOSECOND pulses

Alternate Title: PLONOJO BUFERINIO SLUOKSNIO ĮTAKA PSEUDOMORFINIŲ GaAsBi SLUOKSNIŲ AUGINIMUI IR SAVYBĖMS.

Authors: Pūkienė, S.¹, Jasinskas, A.¹, Zelioli, A.¹, Stanionytė, S.^1,2, Bukauskas, V.³, Čechavičius, B.¹, Dudutienė, E.¹, Butkutė, R.^1,4 renata.butkute@ftmc.lt

Superior Title: Lithuanian Journal of Physics. 2022, Vol. 62 Issue 2, p93-100. 8p.

Subject Terms: *BUFFER layers, *MOLECULAR beam epitaxy, *OPTICAL measurements, *X-ray diffraction measurement, *LATTICE constants, *ENERGY bands

Authors: Hadamek, Tobias¹ (AUTHOR), Posadas, Agham B.¹ (AUTHOR), Al-Quaiti, Fatima² (AUTHOR), Smith, David J.³ (AUTHOR), McCartney, Martha R.³ (AUTHOR), Dombrowski, Eric⁴ (AUTHOR), Demkov, Alexander A.¹ (AUTHOR) demkov@physics.utexas.edu

Superior Title: Journal of Applied Physics. 4/14/2022, Vol. 131 Issue 14, p1-9. 9p.

Subject Terms: *MOLECULAR beam epitaxy, *GALLIUM nitride films, *EPITAXY, *THIN films, *EPITAXIAL layers, *TRANSMISSION electron microscopy, *ELECTRON diffraction, *X-ray diffraction

Authors: Sarney, Wendy L.^{Aff1, IDs1166402410952x_cor1}, Ji, Mihee, Leff, Asher C.^{Aff1, Aff2}, Larkin, LeighAnn S., Garrett, Gregory A., Sampath, Anand V., Wraback, Michael

Superior Title: Journal of Electronic Materials. 53(6):2789-2797