Authors: Liu, Ling-Li¹ (AUTHOR) liulingli@gnnu.edu.cn, Navimipour, Nima Jafari^2,3 (AUTHOR) Jnnima@yuntech.edu.tw

Superior Title: Journal of Circuits, Systems & Computers. Sep2023, Vol. 32 Issue 13, p1-16. 16p.

Subject Terms: *CELLULAR automata, *ELECTRONIC circuit design, *QUANTUM dots, *LOGIC circuits, *LOGIC design

Authors: Rakes, Charles D.

Superior Title: Poptronics. Nov2001, Vol. 2 Issue 11, p57. 5p. 6 Diagrams.

Subject Terms: *TESTING, ELECTRIC batteries, ELECTRONIC circuits

Superior Title: Poptronics. Aug2001, Vol. 2 Issue 8, p47. 5p. 6 Diagrams.

Subject Terms: *TESTING, ELECTRONICS, ELECTRONIC circuits, DESIGN software, TRANSISTORS, ELECTRONIC amplifiers

Authors: Li, Tianjian¹, Xie, Feng¹, Liang, Xiaoyao¹, Xu, Qiang², Chakrabarty, Krishnendu³, Jing, Naifeng¹, Jiang, Li¹

Superior Title: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Jul2016, Vol. 35 Issue 7, p1192-1205. 14p.

Subject Terms: CARBON nanotubes, ELECTRONIC circuits, FIELD-effect transistors, STATIC random access memory chips, INTEGRATED memory circuits, ELECTRONIC systems, COMPLEMENTARY metal oxide semiconductors

Authors: Ting, Hsin-Wen¹

Superior Title: IEEE Transactions on Instrumentation & Measurement. Jun2016, Vol. 65 Issue 6, p1374-1384. 11p.

Subject Terms: ELECTRONIC circuit testers, ELECTRONIC appliance testing, OPERATIONAL amplifiers, ELECTRONIC systems, LINE drivers (Integrated circuits)

Authors: Quinn, Heather¹

Superior Title: IEEE Transactions on Nuclear Science. Mar2014, Vol. 61 Issue 2, p766-786. 21p.

Subject Terms: *ERROR analysis in mathematics, ELECTRONIC circuit design, COMPUTATIONAL physics, ELECTRONIC circuits, RADIATION damage, ROCKET payloads

Authors: Biswas, Satyendra N.¹, Das, Sunil R.², Petriu, Emil M.³

Superior Title: IEEE Transactions on Instrumentation & Measurement. Nov2014, Vol. 63 Issue 11, p2611-2619. 9p.

Subject Terms: *TECHNOLOGY, ELECTRONIC circuits, SYSTEMS on a chip, SENSOR networks, PHYSICS instruments

Authors: Pomeranz, Irith¹ pomeranz@ecn.purdue.edu, Reddy, Sudhakar M.² reddy@engineering.uiowa.edu

Superior Title: IEEE Transactions on Computers. Apr2006, Vol. 55 Issue 4, p491-495. 5p. 1 Diagram, 6 Charts.

Subject Terms: *TESTING, *INTEGRATED circuits, *RELIABILITY in engineering, COMPUTER circuits, ELECTRONIC circuits, LOGIC circuits, ELECTRONIC circuit design, LOGIC design, DIGITAL electronics

Authors: Pomeranz, I.¹, Reddy, S.M.²

Superior Title: IET Computers & Digital Techniques (Institution of Engineering & Technology). Jul2012, Vol. 6 Issue 4, p232-239. 8p. 1 Diagram, 3 Charts.

Subject Terms: *TESTING, *INTEGRATED circuits, *COMPUTER input-output equipment, ELECTRONIC circuits, NON functional requirements (Systems engineering), MATHEMATICAL variables

Authors: Su, Xiaoshan¹, Tian, Ling¹

Superior Title: IEEE Transactions on Instrumentation & Measurement. Sep2012, Vol. 61 Issue 9, p2591-2599. 9p.

Subject Terms: *DATA acquisition systems, *COMPUTER software, *COMPUTER input-output equipment, INTEGRATED circuits testing, ELECTRONIC circuit testers

Superior Title: EC&M Electrical Construction & Maintenance. Mar2000, Vol. 99 Issue 3, p86. 4p. 1 Color Photograph.

Subject Terms: *ELECTRONIC circuit testing equipment industry, *TESTING, ELECTRIC appliance equipment, MEASURING instruments

Authors: DeDad, John

Superior Title: EC&M Electrical Construction & Maintenance. Mar2000, Vol. 99 Issue 3, p26. 5p. 3 Charts, 2 Graphs.

Subject Terms: *ELECTRONIC circuit testing equipment industry, *TESTING, ELECTRIC equipment, MEASURING instruments

Authors: Xiaochun Yu^1,2 xyu1@ece.cmu.edu, DeShawn Blanton, Ronald^1,3 blanton@ece.cmu.edu

Superior Title: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Jun2010, Vol. 29 Issue 6, p977-987. 11p.

Subject Terms: *INTEGRATED circuits, *MICROELECTRONICS, *TESTING, ELECTRONIC circuits, COMPUTER simulation

Authors: Krishnaswamy, Smita¹ smita@eecs.umich.edu, Plaza, Stephen M.² splaza@eecs.umich.edu, Markov, Igor L.³ imarkov@eecs.umich.edu, Hayes, John P.³ jhayes@eecs.umich.edu

Superior Title: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Jan2009, Vol. 28 Issue 1, p74-86. 13p.

Subject Terms: *COMPUTER-aided design, *ERROR analysis in mathematics, *MATHEMATICAL statistics, ELECTRONIC circuit design, SWITCHING circuits, COMPUTER circuits, INTERFACE circuits, LOGIC design

Authors: Kundu, Sandip¹ kundu@ecs.umass.edu, Zachariah, Sujit T.², Yi-Shing Chang², Tirumurti, Chandra²

Superior Title: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Dec2005, Vol. 24 Issue 12, p1909-1915. 7p.

Subject Terms: *INTEGRATED circuits, *SYSTEMS design, *INDUSTRIAL design, ELECTRONIC circuit design, CROSSTALK, LOGIC design

Authors: Yong Chang Kim¹ yong.kim@afit.edu, Agrawal, Vishwani D.² vagrawal@eng.auburn.edu, Saluja, Kewal K.³ saluja@engr.wisc.edu

Superior Title: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Jun2005, Vol. 24 Issue 6, p948-956. 9p.

Subject Terms: *TESTING, *MANUFACTURING defects, AUTOMATIC test equipment, ELECTRONIC circuits, ELECTRONIC instruments, ELECTRIC circuits

Authors: Wang, Li-C.¹ licwang@ece.ucsb.edu, Liou, Jing-Jia¹ timcheng@ece.ucsb.edu, Cheng, Xwang-Ting² jjliou@ee.nthu.edu.tw

Superior Title: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Nov2004, Vol. 23 Issue 11, p1550-1565. 16p.

Subject Terms: *INTEGRATED circuits, *COMPUTER-aided design, *STATISTICS, DELAY faults (Semiconductors), ELECTRONIC circuit design, COMPUTER simulation

Authors: Pomeranz, Irith, Reddy, Sudhakar M.

Superior Title: IEEE Transactions on Computers. Nov2002, Vol. 51 Issue 11, p1282. 12p. 2 Black and White Photographs, 2 Diagrams, 11 Charts.

Subject Terms: *TESTING, ELECTRONIC circuits

Authors: Chuen-Yau Chen¹ cychen@ieee.org

Superior Title: International Journal of Electronics. Apr2008, Vol. 95 Issue 4, p371-382. 12p. 6 Diagrams, 2 Charts.

Subject Terms: *AUTOMATIC control systems, LOGIC circuits, ELECTRONIC circuits testing, SHIFT registers, INTERFACE circuits

Authors: Zorian, Yervant

Superior Title: IEEE Spectrum. Jul99, Vol. 36 Issue 7, p54. 7p. 4 Diagrams, 2 Graphs.

Subject Terms: *INTEGRATED circuits, *TESTING, ELECTRONIC circuits testing