Authors: Izhnin, I. I.^{Aff1, Aff2}, Fitsych, O. I.^Aff1, Voitsekhovskii, A. V.^Aff2, Korotaev, A. G.^Aff2, Mynbaev, K. D.^Aff3, Kurbanov, K. R.^Aff4, Varavin, V. S.^Aff5, Dvoretskii, S. A.^Aff5, Mikhailov, N. N.^Aff5, Remesnik, V. G.^Aff5, Yakushev, M. V.^Aff5, Bonchyk, O. Yu.^Aff6, Savytskyy, H. V.^Aff6, Świątek, Z.^Aff7, Morgiel, J.^Aff7

Superior Title: Russian Physics Journal. 63(2):290-295

Authors: Izhnin, I., Voitsekhovskii, A. V., Korotaev, A. G., Mynbaev, K. D., Swiatek, Z., Morgiel, J., Fitsych, O. I., Varavin, V. S., Marin, D. V., Yakushev, M. V., Bonchyk, O. Yu., Savytskyy, H. V.

Superior Title: Applied Nanoscience; Mar2022, Vol. 12 Issue 3, p395-401, 7p

Subject Terms: TRANSMISSION electron microscopy, ARSENIC, ION implantation

Authors: Bonchyk, O. Yu., Savytskyy, H. V., Izhnin, I. I., Mynbaev, K. D., Syvorotka, I. I., Korotaev, A. G., Voitsekhovskii, A. V., Fitsych, O. I., Varavin, V. S., Marin, D. V., Mikhailov, N. N., Yakushev, M. V., Swiatek, Z., Morgiel, J., Jakiela, R.

Superior Title: Applied Nanoscience; Dec2020, Vol. 10 Issue 12, p4971-4976, 6p

Subject Terms: MOLECULAR beam epitaxy, TRANSMISSION electron microscopy, HIGH resolution electron microscopy, ARSENIC, DISLOCATION loops, ION implantation, SURFACE diffusion

Authors: Izhnin, I I (AUTHOR) mynkad@mail.ioffe.ru, Mynbaev, K D (AUTHOR), Voitsekhovskii, A V (AUTHOR), Nesmelov, S N (AUTHOR), Dzyadukh, S M (AUTHOR), Korotaev, A G (AUTHOR), Varavin, V S (AUTHOR), Dvoretsky, S A (AUTHOR), Marin, D V (AUTHOR), Yakushev, M V (AUTHOR), Swiatek, Z (AUTHOR), Morgiel, J (AUTHOR), Bonchyk, O Yu (AUTHOR)

Superior Title: Semiconductor Science & Technology. Nov2020, Vol. 35 Issue 11, p1-9. 9p.

Subject Terms: *ARSENIC, *DISLOCATION loops, *ION implantation, *CAPACITANCE measurement, *TRANSMISSION electron microscopy, *ZINC telluride, *SPECTRUM analysis