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Academic Journal
Authors: Buh, G. H., Chung, H. J., Yi, J. H., Yoon, I. T., Kuk, Y.
Superior Title: Journal of Applied Physics; 7/1/2001, Vol. 90 Issue 1, p443, 6p, 2 Black and White Photographs, 2 Diagrams, 8 Graphs
Subject Terms: SILICON diodes, SCANNING probe microscopy, ELECTRONICS