Authors: JOSHI, K, HUNG, S, MUKHOPADHYAY, S, SATO, T, BEVAN, M, RAJAMOHANAN, B, WEI, A, NOORI, A, MCDOUGALL, B, NI, C, LAZIK, C, SAHELI, G, LIU, P, CHU, D, DATE, L, DATTA, S, BRAND, A, SWENBERG, J, MAHAPATRA, S
Subject Terms: Dciv, Equivalent Oxide Thickness (Eot) Scaling, Flicker Noise, Gate Leakage, Hkmg, Interlayer (Il) Scaling, Mobility, Negative-Bias Temperature Instability (Nbti), Positive-Bias Temperature Instability (Pbti)
Relation: IEEE ELECTRON DEVICE LETTERS, 34(1)3-5; http://dx.doi.org/10.1109/LED.2012.2222338; http://dspace.library.iitb.ac.in/jspui/handle/100/15540
Authors: Joshi, K., Hung, S., Mukhopadhyay, S., Sato, T., Bevan, M., Rajamohanan, B., Wei, A., Noori, A., McDougall, B., Ni, C., Lazik, C., Saheli, G., Liu, P., Chu, D., Date, L., Datta, S., Brand, A., Swenberg, J., Mahapatra, S.
Superior Title: IEEE Electron Device Letters; Jan2013, Vol. 34 Issue 1, p3-5, 3p