Authors: Pancaldi A., Raimondo L., Minotto A., Sassella A.

Contributors: Pancaldi, A, Raimondo, L, Minotto, A, Sassella, A

Subject Terms: thin film growth dynamics, porphyrins, post-growth processes, organic molecular beam epitaxy, ripening, FIS/01 - FISICA SPERIMENTALE

File Description: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/pmid/36812106; info:eu-repo/semantics/altIdentifier/wos/WOS:000935892900001; volume:39; issue:9; firstpage:3266; lastpage:3272; numberofpages:7; journal:LANGMUIR; https://hdl.handle.net/10281/418725; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85148853558

Availability: https://doi.org/10.1021/acs.langmuir.2c03066
https://hdl.handle.net/10281/418725

Authors: Grazianetti, Carlo, Bonaventura, Eleonora, Martella, Christian, Molle, Alessandro, Lupi, Stefano

Contributors: Grazianetti, C, Bonaventura, E, Martella, C, Molle, A, Lupi, S

Subject Terms: absorption coefficient, molecular beam epitaxy, optical spectroscopy, stanene, Xene

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000635462900006; volume:4; issue:3; firstpage:2351; lastpage:2356; numberofpages:6; journal:ACS APPLIED NANO MATERIALS; http://hdl.handle.net/10281/321624; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85103482299

Availability: https://doi.org/10.1021/acsanm.0c03221
http://hdl.handle.net/10281/321624

Authors: BUSSETTI, GIANLORENZO, Cirilli, S, Violante, A, CHIOSTRI, VINCENZO, GOLETTI, CLAUDIO, CHIARADIA, PIETRO, Sassella, A, Campione, M, Raimondo, L, Braga, D, Borghesi, A.

Contributors: Bussetti, G, Cirilli, S, Violante, A, Chiostri, V, Goletti, C, Chiaradia, P, Sassella, A, Campione, M, Raimondo, L, Braga, D, Borghesi, A

Subject Terms: Crystallinity, Epitaxial relation, Ex situ, Heteroepitaxy, High sensitivity, Homoepitaxy, In-situ, Organic molecular beam epitaxy, Quaterthiophene, Reflectance anisotropy spectroscopy, Anisotropy, Atomic force microscopy, Epitaxial film, Epitaxial layer, Heterojunction bipolar transistor, Molecular beam epitaxy, Molecular beam, Molecular dynamic, Monolayer, Optical microscopy, Reflection, Vacuum, Vacuum deposition, Epitaxial growth, Settore FIS/03 - FISICA DELLA MATERIA

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000267600000074; volume:27; issue:4; firstpage:1029; lastpage:1034; numberofpages:6; journal:JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. A. VACUUM, SURFACES, AND FILMS; http://hdl.handle.net/2108/25623; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-67650281233

Availability: https://doi.org/10.1116/1.3155399
http://hdl.handle.net/2108/25623

Authors: Tisbi E., Placidi E., Magri R., Prosposito P., Francini R., Zaganelli A., Cecchi S., Zallo E., Calarco R., Luna E., Honolka J., Vondracek M., Colonna S., Arciprete F.

Contributors: Tisbi, E, Placidi, E, Magri, R, Prosposito, P, Francini, R, Zaganelli, A, Cecchi, S, Zallo, E, Calarco, R, Luna, E, Honolka, J, Vondracek, M, Colonna, S, Arciprete, F

Subject Terms: Optoelectronics, III-V semiconductors, GaAsBi, strain engineering, telecommunication bands, molecular beam epitaxy

File Description: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000548460800001; volume:14; issue:1; journal:PHYSICAL REVIEW APPLIED; https://hdl.handle.net/10281/405399; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85088457307

Availability: https://doi.org/10.1103/PhysRevApplied.14.014028
https://hdl.handle.net/10281/405399

Authors: Zhang, JJ, Rastelli, A, Hrauda, N, Groiss, H, Stangl, J, Schaffler, F, Schmidt, OG, Bauer, G., MONTALENTI, FRANCESCO CIMBRO MATTIA, SCOPECE, DANIELE, PEZZOLI, FABIO, MIGLIO, LEONIDA

Contributors: Zhang, J, Montalenti, F, Rastelli, A, Hrauda, N, Scopece, D, Groiss, H, Stangl, J, Pezzoli, F, Schaffler, F, Schmidt, O, Miglio, L, Bauer, G

Subject Terms: Si,Ge,islands,elastic relaxation, intermixing, molecular beam epitaxy, FIS/03 - FISICA DELLA MATERIA

Relation: info:eu-repo/semantics/altIdentifier/pmid/21230984; info:eu-repo/semantics/altIdentifier/wos/WOS:000282816300012; volume:105; issue:16; journal:PHYSICAL REVIEW LETTERS; http://hdl.handle.net/10281/17414; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-77957913289

Availability: https://doi.org/10.1103/PhysRevLett.105.166102
http://hdl.handle.net/10281/17414

Authors: Orsini, PG, Sanna, S, MEDAGLIA, PIER GIANNI, TRAVERSA, ENRICO, LICOCCIA, SILVIA, TEBANO, ANTONELLO, BALESTRINO, GIUSEPPE

Contributors: Orsini, Medaglia, Pg, Pg, Sanna, S, Traversa, E, Licoccia, S, Tebano, A, Balestrino, G

Subject Terms: Epitaxial superlattice, Epitaxial thin film, Fluorite superlattice, Gadolinium doped ceria, Gallate, Heterostructure, Ionic conductor, Lattice parameter, Number of layer, Perovskite substrate, Pulsed-laser deposition technique, Strain effect, Strontium titanate, Unit cell, Yttrium-stabilized zirconia, Cerium compound, Epitaxial growth, Fluorspar, Gadolinium, Laser, Molecular beam epitaxy, Oxide mineral, Perovskite, Pulsed laser deposition, Strontium, Strontium compound, Thin film device, X ray diffraction, Yttrium, Zirconia

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000267444900039; volume:46; issue:1-2; firstpage:223; lastpage:226; journal:SUPERLATTICES AND MICROSTRUCTURES; http://hdl.handle.net/2108/29574; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-67249131914

Availability: https://doi.org/10.1016/j.spmi.2008.10.047
http://hdl.handle.net/2108/29574

Authors: SALVATO, MATTEO, Aurigemma, A., Tesauro, A., Attanasio, C.

Contributors: Salvato, M, Aurigemma, A, Tesauro, A, Attanasio, C

Subject Terms: Molecular beam epitaxy (MBE), Reflection high energy electron diffraction (RHEED), X-ray diffraction, X-ray reflectivity, Settore FIS/03 - FISICA DELLA MATERIA

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000252817000021; volume:82; issue:5; firstpage:556; lastpage:560; journal:VACUUM; http://hdl.handle.net/2108/29426; info:eu-repo/semantics/altIdentifier/scopus/http://www.scopus.com/inward/record.url?eid=2-s2.0-37049012245&partnerID=40&md5=beef826a4a0209097b6aac5c446bf4ea; www.elsevier.com/locate/vacuum

Availability: https://doi.org/10.1016/j.vacuum.2007.07.058
http://hdl.handle.net/2108/29426

Authors: Yesin, MY, Nikiforov, AI, Timofeev, VA, Mashanov, VI, Tuktamyshev, AR, Loshkarev, ID, Pchelyakov, OP

Contributors: Yesin, M, Nikiforov, A, Timofeev, V, Mashanov, V, Tuktamyshev, A, Loshkarev, I, Pchelyakov, O

Subject Terms: atomic force microscopy, diffraction of fast electron, Ge island, molecular beam epitaxy, Si (100) surface

File Description: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000427994600002; volume:60; issue:11; firstpage:1864; lastpage:1870; numberofpages:7; journal:RUSSIAN PHYSICS JOURNAL; https://hdl.handle.net/10281/415103; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85043678273

Availability: https://doi.org/10.1007/s11182-018-1295-8
https://hdl.handle.net/10281/415103

Authors: LATINI, VALERIO, Placidi, E, Magri, R, TISBI, ELISA, PATELLA, FULVIA, ARCIPRETE, FABRIZIO

Contributors: Latini, V, Placidi, E, Magri, R, Tisbi, E, Patella, F, Arciprete, F

Subject Terms: Cap Layer, Finite Element Method: Strain, Molecular Beam Epitaxy, Quantum Dot, Materials Science (all), Settore FIS/03 - FISICA DELLA MATERIA

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000410792700015; volume:9; issue:7; firstpage:1083; lastpage:1094; numberofpages:12; journal:NANOSCIENCE AND NANOTECHNOLOGY LETTERS; http://hdl.handle.net/2108/189768; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85027975108; http://www.ingentaconnect.com/search/download?pub=infobike://asp/nnl/2017/00000009/00000007/art00015&mimetype=application/pdf&exitTargetId=1503044115716

Availability: https://doi.org/10.1166/nnl.2017.2444
http://hdl.handle.net/2108/189768
http://www.ingentaconnect.com/search/download?pub=infobike://asp/nnl/2017/00000009/00000007/art00015&mimetype=application/pdf&exitTargetId=1503044115716

Authors: Cecchi S., Zallo E., Momand J., Wang R., Kooi B. J., Verheijen M. A., Calarco R.

Contributors: Cecchi, S, Zallo, E, Momand, J, Wang, R, Kooi, B, Verheijen, M, Calarco, R

Subject Terms: Van der Waals, superlattices, molecular beam epitaxy, phase change materials

File Description: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000395031400007; volume:5; issue:2; journal:APL MATERIALS; https://hdl.handle.net/10281/405406; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85014024332

Availability: https://doi.org/10.1063/1.4976828
https://hdl.handle.net/10281/405406

Authors: Mano T., Mitsuishi K., Ha N., Ohtake A., Castellano A., Sanguinetti S., Noda T., Sakuma Y., Kuroda T., Sakoda K.

Contributors: Mano, T, Mitsuishi, K, Ha, N, Ohtake, A, Castellano, A, Sanguinetti, S, Noda, T, Sakuma, Y, Kuroda, T, Sakoda, K

Subject Terms: semiconductor, Molecular Beam Epitaxy, FIS/03 - FISICA DELLA MATERIA

File Description: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000382902400075; volume:16; issue:9; firstpage:5412; lastpage:5417; numberofpages:6; journal:CRYSTAL GROWTH & DESIGN; https://hdl.handle.net/10281/422039; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84986540229

Availability: https://doi.org/10.1021/acs.cgd.6b00899
https://hdl.handle.net/10281/422039

Authors: BIETTI, SERGIO, SOMASCHINI, CLAUDIO, ESPOSITO, LUCA, SANGUINETTI, STEFANO, Fedorov, A

Contributors: Bietti, S, Somaschini, C, Esposito, L, Fedorov, A, Sanguinetti, S

Subject Terms: surface diffusion, molecular beam epitaxy, GaAs

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000342837000054; volume:116; issue:11; journal:JOURNAL OF APPLIED PHYSICS; http://hdl.handle.net/10281/68242; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84907257164

Availability: https://doi.org/10.1063/1.4895986
http://hdl.handle.net/10281/68242

Authors: ARCIPRETE, FABRIZIO, PATELLA, FULVIA, Placidi, E, Magri, R, Del Gaudio, D

Contributors: Arciprete, F, Placidi, E, Magri, R, Del Gaudio, D, Patella, F

Subject Terms: Quantum Dots, Molecular Beam Epitaxy, Rate Equations, Settore FIS/03 - FISICA DELLA MATERIA

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000327900600001; volume:28; issue:23; firstpage:3201; lastpage:3209; numberofpages:9; journal:JOURNAL OF MATERIALS RESEARCH; http://hdl.handle.net/2108/79727; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84890127395; http://journals.cambridge.org/action/displayAbstract?fromPage=online&aid=9111513

Availability: https://doi.org/10.1557/jmr.2013.340
http://hdl.handle.net/2108/79727
http://journals.cambridge.org/action/displayAbstract?fromPage=online&aid=9111513

Authors: ARCIPRETE, FABRIZIO, FANFONI, MASSIMO, BALZAROTTI, ADALBERTO, PATELLA, FULVIA, Placidi, E, Magri, R

Contributors: Arciprete, F, Placidi, E, Magri, R, Fanfoni, M, Balzarotti, A, Patella, F

Subject Terms: quantum dot, molecular beam epitaxy, kinetic modeling, rate equations, Settore FIS/03 - FISICA DELLA MATERIA

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000319856300023; volume:7; issue:5; firstpage:3868; lastpage:3875; numberofpages:8; journal:ACS NANO; http://hdl.handle.net/2108/74727; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84878289702

Availability: https://doi.org/10.1021/nn401338v
http://hdl.handle.net/2108/74727

Authors: Campione, M., Borghesi, A., Laicini, M., Sassella, A., GOLETTI, CLAUDIO, BUSSETTI, GIANLORENZO, CHIARADIA, PIETRO

Contributors: Campione, M, Borghesi, A, Laicini, M, Sassella, A, Goletti, C, Bussetti, G, Chiaradia, P

Subject Terms: Anisotropy, Computer simulation, Crystallization, Metastable phase, Molecular beam epitaxy, Reflection, In situ optical reflectance anisotropy measurement, Material optical response, Organic molecular thin film, Postgrowth phenomena, Thin films, Settore FIS/03 - FISICA DELLA MATERIA

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000251987800029; volume:127; issue:24; journal:THE JOURNAL OF CHEMICAL PHYSICS; http://hdl.handle.net/2108/29583; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-37549054005

Availability: https://doi.org/10.1063/1.2814244
http://hdl.handle.net/2108/29583

Authors: Sassella, A, Borghesi, A, Campione, M, Tavazzi, S, GOLETTI, CLAUDIO, BUSSETTI, GIANLORENZO, CHIARADIA, PIETRO

Contributors: Sassella, A, Borghesi, A, Campione, M, Tavazzi, S, Goletti, C, Bussetti, G, Chiaradia, P

Subject Terms: Epitaxial growth, Film growth, Light reflection, Molecular beam epitaxy, Thickness measurement, Thin film, Film thickne, Homoepitaxy, Optical anisotropy, Reflectance anisotropy spectra, Single crystals, Settore FIS/03 - FISICA DELLA MATERIA

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000243157600027; volume:89; issue:26; journal:APPLIED PHYSICS LETTERS; http://hdl.handle.net/2108/30939; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-33846111324

Availability: https://doi.org/10.1063/1.2423322
http://hdl.handle.net/2108/30939

Authors: PATELLA, FULVIA, ARCIPRETE, FABRIZIO, FANFONI, MASSIMO, BALZAROTTI, ADALBERTO, Sessi, V., Placidi, E.

Contributors: Patella, F, Arciprete, F, Fanfoni, M, Sessi, V, Balzarotti, A, Placidi, E

Subject Terms: Mass transfer, Molecular beam epitaxy, Monolayer, Nucleation, Semiconducting indium, Semiconductor growth, Semiconductor quantum dot, Surface phenomena, Adsorption-desorption processe, Compressive strain, Surface mass diffusion, Surface mass transport, Reflection high energy electron diffraction, Settore FIS/03 - FISICA DELLA MATERIA

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000234118900040; volume:87; issue:25; firstpage:1; lastpage:3; journal:APPLIED PHYSICS LETTERS; http://hdl.handle.net/2108/37022; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-29144463682

Availability: https://doi.org/10.1063/1.2147731
http://hdl.handle.net/2108/37022

Authors: SASSELLA, ADELE, CAMPIONE, MARCELLO, MORET, MASSIMO, BORGHESI, ALESSANDRO, Goletti, C, Bussetti, G, Chiaradia, P.

Contributors: Sassella, A, Campione, M, Moret, M, Borghesi, A, Goletti, C, Bussetti, G, Chiaradia, P

Subject Terms: Organic semiconductor, organic molecular beam epitaxy, growth dynamic, reflectance anisotropy spectroscopy, FIS/01 - FISICA SPERIMENTALE

File Description: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/pmid/21823601; info:eu-repo/semantics/altIdentifier/wos/WOS:000230244300013; volume:71; issue:20; firstpage:1; lastpage:4; numberofpages:4; journal:PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS; http://hdl.handle.net/10281/7646; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-33344470793

Availability: https://doi.org/10.1103/PhysRevB.71.201311
http://hdl.handle.net/10281/7646

Authors: ARCIPRETE, FABRIZIO, GOLETTI, CLAUDIO, CHIARADIA, PIETRO, FANFONI, MASSIMO, PATELLA, FULVIA, BALZAROTTI, ADALBERTO, Placidi, E, Hogan, C

Contributors: Arciprete, F, Goletti, C, Placidi, E, Chiaradia, P, Fanfoni, M, Patella, F, Hogan, C, Balzarotti, A

Subject Terms: MOLECULAR-BEAM-EPITAXY, OPTICAL-PROPERTIES, DIFFERENTIAL REFLECTIVITY, ULTRAHIGH-VACUUM, 001 GAAS, SPECTROSCOPY, DIFFRACTION, SCATTERING, SI(111)2X1, GAAS(100), Settore FIS/03 - FISICA DELLA MATERIA

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000185861900064; volume:68; issue:12; firstpage:125328; journal:PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS; http://hdl.handle.net/2108/45850; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-0242440124

Availability: https://doi.org/10.1103/PhysRevB.68.125328
http://hdl.handle.net/2108/45850

Authors: BALZAROTTI, ADALBERTO, FANFONI, MASSIMO, PATELLA, FULVIA, ARCIPRETE, FABRIZIO, DEL SOLE, RODOLFO, Placidi, E, Onida, G

Contributors: Balzarotti, A, Fanfoni, M, Patella, F, Arciprete, F, Placidi, E, Onida, G, DEL SOLE, R

Subject Terms: Density functional calculation, Electron energy loss spectroscopy (EELS), Molecular beam epitaxy, Semiconducting surface, Surface electronic phenomena (work function, surface potential, surface states, etc.), Surface relaxation and reconstruction, Settore FIS/03 - FISICA DELLA MATERIA

Relation: volume:524; firstpage:71; journal:SURFACE SCIENCE LETTERS; http://hdl.handle.net/2108/44935

Availability: https://doi.org/10.1016/S0039-6028(02)02540-2
http://hdl.handle.net/2108/44935