Authors: Cui, Jiangwei¹ cuijw@ms.xjb.ac.cn, Zheng, Qiwen¹ qwzheng@ms.xjb.ac.cn, Li, Yudong¹, Guo, Qi¹

Superior Title: IEEE Transactions on Nuclear Science. May2022, Vol. 69 Issue 5, p1044-1050. 7p.

Subject Terms: STATIC random access memory, LOGIC circuits, CELL anatomy

Authors: Pande, Nakul¹ nakul@umn.edu, Kumar, Saurabh¹, Everson, Luke R.¹, Park, Gyusung¹, Ahmed, Ibrahim¹, Kim, Chris H.¹ chriskim@umn.edu

Superior Title: IEEE Transactions on Nuclear Science. Dec2021, Vol. 68 Issue 12, p2736-2747. 12p.

Subject Terms: *LOGIC, LOGIC circuits, SOFT errors, THRESHOLD voltage, NEUTRON irradiation, TRANSISTORS

Authors: Feeley, Alex¹ alexandra.feeley.lamb@vanderbilt.edu, Xiong, Yoni¹ yoni.xiong@vanderbilt.edu, Guruswamy, Nithin¹ nithin.kumar.guruswamy@vanderbilt.edu, Bhuva, B. L.¹ bharat.bhuva@vanderbilt.edu

Superior Title: IEEE Transactions on Nuclear Science. Mar2022, Vol. 69 Issue 3, p327-332. 6p.

Subject Terms: STRAY currents, LOGIC circuits, DYNAMIC testing, THRESHOLD voltage

Authors: Rigoni Garola, A.¹ andrea.rigoni@igi.cnr.it, Cavazzana, R.¹, Gobbin, M.¹, Delogu, R. S.¹, Manduchi, G.¹, Taliercio, C.¹, Luchetta, A.¹

Superior Title: IEEE Transactions on Nuclear Science. Aug2021, Vol. 68 Issue 8, p2165-2172. 8p.

Subject Terms: DATA integration, PROGRAMMABLE logic devices, GATE array circuits, FIELD programmable gate arrays, ADAPTIVE computing systems

Authors: Huang, Pengcheng¹ csnre_pchuang@163.com, Zhao, Zhenyu¹, Chi, Yaqing¹, Liang, Bin¹ bin.liang@163.com, Ma, Chiyuan¹, Sun, Qian¹, Wu, Zhenyu¹

Superior Title: IEEE Transactions on Nuclear Science. May2021, Vol. 68 Issue 5, p1103-1110. 8p.

Subject Terms: *COMMERCIAL art, LOGIC circuits, CYCLOTRONS, CELL anatomy, TRANSIENT analysis

Geographic Terms: LANZHOU Shi (China)

Authors: Aguiar, Y. Q.¹ (AUTHOR) aguiar@ies.univ-montp2.fr, Wrobel, F.¹ (AUTHOR), Autran, J.-L.² (AUTHOR), Leroux, P.³ (AUTHOR), Saigne, F.¹ (AUTHOR), Touboul, A. D.¹ (AUTHOR), Pouget, V.¹ (AUTHOR)

Superior Title: IEEE Transactions on Nuclear Science. Jul2019, Vol. 66 Issue 7, p1465-1472. 8p.

Subject Terms: *MATHEMATICAL optimization, *LOGIC, LINEAR energy transfer, LOGIC circuits, HEAVY ions

Authors: Xue, Tao¹, Zhu, Jinfu¹, Gong, Guanghua¹, Wei, Liangjun¹, Luo, Yang¹, Li, Jianmin¹

Superior Title: IEEE Transactions on Nuclear Science. May2018, Vol. 65 Issue 5, p1169-1179. 11p.

Subject Terms: *DATA acquisition systems, SOFTWARE architecture, PROGRAMMABLE logic devices, ANALOG-to-digital converters, DIGITAL-to-analog converters

Authors: Jiang, H.¹, Zhang, H.¹, Kauppila, J. S.¹, Massengill, L. W.¹, Bhuva, B. L.¹

Superior Title: IEEE Transactions on Nuclear Science. Jan2018, Vol. 65 Issue 1, p304-310. 7p.

Subject Terms: *INTEGRATED circuits, *MATHEMATICAL models, LOGIC circuits, COMPUTER simulation, ELECTRONIC circuits, ELECTRIC power consumption

Authors: Mitrovic, Mladen¹, Hofbauer, Michael¹, Schneider-Hornstein, Kerstin¹, Goll, Bernhard¹, Voss, Kay-Obbe², Zimmermann, Horst¹

Superior Title: IEEE Transactions on Nuclear Science. Jan2018, Vol. 65 Issue 1, p382-390. 9p.

Subject Terms: *INTEGRATED circuits, LOGIC circuits, ULTRAVIOLET radiation, ELECTRIC resistors, COMPLEMENTARY metal oxide semiconductors, ELECTRIC insulators & insulation, ELECTRONIC circuits

Authors: Chen, R. M.¹, Diggins, Z. J.², Mahatme, N. N.³, Wang, L.⁴, Zhang, E. X.², Chen, Y. P.², Zhang, H.², Liu, Y. N.¹, Narasimham, B.⁵, Witulski, A. F.², Bhuva, B. L.², Fleetwood, D. M.²

Superior Title: IEEE Transactions on Nuclear Science. Aug2017, Vol. 64 Issue 8 Part 1, p2122-2128. 7p.

Subject Terms: *POWER resources, SEQUENTIAL circuits, LOGIC circuits, ELECTRIC potential, TEMPERATURE

Authors: Wang, Yonggang¹, Liu, Chong¹

Superior Title: IEEE Transactions on Nuclear Science. Oct2016 Part 2, Vol. 63 Issue 5b, p2632-2638. 7p.

Subject Terms: FIELD programmable gate arrays, PROGRAMMABLE logic devices, FIELD programmable analog arrays, LOGIC devices, PROGRAMMABLE circuits, NETWORK processors

Authors: Rizzo, Marta, Brucoli, Matteo, Danzeca, Salvatore, Masi, Alessandro, Pineda, Alvaro, Servera Mas, Bartomeu

Superior Title: IEEE Transactions on Nuclear Science; Aug2022, Vol. 69 Issue 8, p1876-1883, 8p

Subject Terms: DOSIMETERS, ELECTRIC fields, SILICA, RADIATION measurements, IONIZING radiation, LOGIC circuits

Authors: Bonaldo, Stefano, Gorchichko, Mariia, Zhang, En Xia, Ma, Teng, Mattiazzo, Serena, Bagatin, Marta, Paccagnella, Alessandro, Gerardin, Simone, Schrimpf, Ronald D., Reed, Robert A., Linten, Dimitri, Mitard, Jerome, Fleetwood, Daniel M.

Superior Title: IEEE Transactions on Nuclear Science; Jul2022, Vol. 69 Issue 7, p1444-1452, 9p

Subject Terms: TRANSISTORS, NANOWIRES, SILICON nanowires, DIELECTRICS, STRAY currents, THRESHOLD voltage, LOGIC circuits

Authors: Ma, Teng, Bonaldo, Stefano, Mattiazzo, Serena, Baschirotto, Andrea, Enz, Christian, Paccagnella, Alessandro, Gerardin, Simone

Superior Title: IEEE Transactions on Nuclear Science; Jul2022, Vol. 69 Issue 7, p1437-1443, 7p

Subject Terms: TRANSISTORS, INDIUM gallium zinc oxide, THRESHOLD voltage, LOGIC circuits, DOPING agents (Chemistry), TEMPERATURE measurements

Authors: Dewitte, Hugo, Paillet, Philippe, Le Roch, Alexandre, Rizzolo, Serena, Marcandella, Claude, Goiffon, Vincent

Superior Title: IEEE Transactions on Nuclear Science; Jul2022, Vol. 69 Issue 7, p1428-1436, 9p

Subject Terms: STRAY currents, TRANSISTORS, DIELECTRICS, LOGIC circuits

Authors: Toguchi, Shintaro, Zhang, En Xia, Rony, Mohammed W., Luo, Xuyi, Fleetwood, Daniel M., Schrimpf, Ronald D., Moreau, Stephane, Cheramy, Severine, Batude, Perrine, Brunet, Laurent, Andrieu, Francois, Alles, Michael L.

Superior Title: IEEE Transactions on Nuclear Science; Jul2022, Vol. 69 Issue 7, p1420-1427, 8p

Subject Terms: DIELECTRIC devices, ORGANIC field-effect transistors, COMPUTER-aided design, ELECTRIC fields, LOGIC circuits

Authors: Xiong, Yoni, Feeley, Alexandra T., Ball, Dennis R., Bhuva, Bharat L.

Superior Title: IEEE Transactions on Nuclear Science; Mar2022, Vol. 69 Issue 3, p422-428, 7p

Subject Terms: SEQUENTIAL circuits, LINEAR energy transfer, LOGIC circuits, THRESHOLD voltage, LOGIC

Authors: Jiang, H.¹, Zhang, H.¹, Assis, T. R.², Narasimham, B.³, Bhuva, B. L.¹, Holman, W. T.¹, Massengill, L. W.¹

Superior Title: IEEE Transactions on Nuclear Science. Jan2017, Vol. 64 Issue 1, part 1, p477-482. 6p.

Subject Terms: SINGLE event effects, LOGIC circuits, FLIP-flop circuits, FIELD-effect transistors, COMPLEMENTARY metal oxide semiconductors

Authors: Sanchez-Clemente, A. J.¹, Entrena, L.¹, Garcia-Valderas, M.¹

Superior Title: IEEE Transactions on Nuclear Science. Aug2016 Part 1, Vol. 63 Issue a4, p2233-2240. 8p.

Subject Terms: COMPUTER reliability, LOGIC circuits, SINGLE event effects, IRRADIATION, SOFT errors

Authors: Peng, Chao, Lei, Zhifeng, Zhang, Zhangang, Chen, Yiqiang, He, Yujuan, Yao, Bin, En, Yunfei

Superior Title: IEEE Transactions on Nuclear Science; May2022, Vol. 69 Issue 5, p1037-1043, 7p

Subject Terms: STRAY currents, LEAKAGE, LOGIC circuits, HEAVY ions, IRRADIATION