Authors: Wu, Lijuan, Liu, Mengjiao, Zhang, Mengyuan, Liang, Jiahui, Yang, Gang, Zhang, Tengfei, Liu, Qing

Superior Title: IEEE Transactions on Electron Devices; February 2023, Vol. 70 Issue: 2 p647-652, 6p

Authors: Wu, Lijuan, Song, Xuanting, Zhang, Banghui, Liu, Heng, Liu, Qing, Liu, Yangzhi, Qiu, Tao

Superior Title: IEEE Transactions on Electron Devices; January 2023, Vol. 70 Issue: 1 p185-190, 6p

Authors: Wu, Lijuan¹ 305719669@qq.com, Chen, Xing¹, Zeng, Jinsheng¹, Su, Shaolian¹, Wu, Haifeng¹

Superior Title: IEEE Transactions on Electron Devices. May2022, Vol. 69 Issue 5, p2560-2565. 6p.

Subject Terms: *INTEGRATED circuits, BREAKDOWN voltage, ELECTRIC fields, LOGIC circuits, INTEGRATING circuits, ELECTRODES

Authors: Zhang, Wentong, Zhang, Bo, Qiao, Ming, Wu, Lijuan, Mao, Kun, Li, Zhaoji

Superior Title: IEEE Transactions on Electron Devices; Feb2014, Vol. 61 Issue 2, p518-524, 7p

Subject Terms: FIELD-effect transistors, PERFORMANCE of field-effect transistors, HETEROSTRUCTURES, BREAKDOWN voltage, ELECTRIC potential, MOS logic circuits, MATHEMATICAL models