Authors: Ng, C. Y., Chen, T. P., Ding, L., Yang, M., Wong, J. I., Zhao, P., Yang, X. H., Liu, K. Y., Tse, M. S., Trigg, A. D., Fung, S.

Superior Title: IEEE Transactions on Electron Devices; Apr2006, Vol. 53 Issue 4, p730-736, 7p, 1 Diagram, 1 Chart, 5 Graphs

Subject Terms: SEMICONDUCTOR nanocrystals, METAL oxide semiconductor field-effect transistors, ION implantation, DIELECTRIC devices, FERROELECTRIC RAM, SILICON

Authors: Matsik, Steven G., Rinzan, Mohamed B. M., Esaev, Dmitriy G., Perera, A. G. Unil, von Winckel, G., Stintz, Andreas, Krishna, Sanjay, Liu, H. C., Byloos, M. D., Oogarah, T., Sproule, G. I., Liu, K., Buchanan, M.

Superior Title: IEEE Transactions on Electron Devices; Mar2005, Vol. 52 Issue 3, p413-418, 6p

Subject Terms: DOPED semiconductors, SEMICONDUCTOR doping, DETECTORS, MOLECULAR emission cavity analysis, ELECTRON paramagnetic resonance, MAGNETIC resonance

Authors: Anwar, A.F.M., Liu, K.-W., Khondker, A.N.

Superior Title: IEEE Transactions on Electron Devices; 1995, Vol. 42 Issue 4, p586-590, 5p

Authors: Anwar, A.F.M., Liu, K.-W.

Superior Title: IEEE Transactions on Electron Devices; 1993, Vol. 40 Issue 6, p1174-1176, 3p

Authors: Wang, Y.G., Scott, D.B., Wu, J., Waller, J.L., Hu, J., Liu, K., Ukraintsev, V.

Superior Title: IEEE Transactions on Electron Devices; Feb2003, Vol. 50 Issue 2, p529, 2p, 9 Diagrams, 8 Graphs

Subject Terms: METAL oxide semiconductor field-effect transistors, ELECTRIC currents, STRAINS & stresses (Mechanics), ELECTRON mobility