Authors: Van Cuong, Vuong¹ vuongvancuong@hiroshima-u.ac.jp, Meguro, Tatsuya¹ meguro@hiroshima-u.ac.jp, Ishikawa, Seiji² seiji_ishikawa@phenitec.co.jp, Maeda, Tomonori² t-maeda@phenitec.co.jp, Sezaki, Hiroshi² hiroshi-sezaki@phenitec.co.jp, Kuroki, Shin-Ichiro¹ skuroki@hiroshima-u.ac.jp

Superior Title: IEEE Transactions on Electron Devices. Aug2022, Vol. 69 Issue 8, p4194-4199. 6p.

Subject Terms: *INTEGRATED circuits, ELECTRONIC circuits, OHMIC contacts, METAL oxide semiconductor field-effect transistors, CHARGE carrier mobility

Authors: Ying, Hanbin¹ ying.hanbin@gatech.edu, Teng, Jeffrey W.¹, Cressler, John D.¹ cressler@ece.gatech.edu

Superior Title: IEEE Transactions on Electron Devices. Apr2021, Vol. 68 Issue 4, p1439-1445. 7p.

Subject Terms: ELECTRONIC circuits, HETEROJUNCTION bipolar transistors, MIRRORS, LOW temperatures, TEMPERATURE

Authors: Yang, Huiping¹ yanghuiping05@126.com, Huang, Wei² whuang@esdemc.com, Zeng, Biqing¹ biqingzeng@126.com, Wen, He³ he_wen82@126.com

Superior Title: IEEE Transactions on Electron Devices. Apr2021, Vol. 68 Issue 4, p1918-1923. 6p.

Subject Terms: ELECTRONIC circuits, ELECTRIC currents, RADIO frequency allocation, HARMONIC analysis (Mathematics), RADIO frequency

Authors: Pelloux-Prayer, Johan¹ johanpp@eng.au.dk, Moradi, Farshad¹ moradi@eng.au.dk

Superior Title: IEEE Transactions on Electron Devices. Jul2020, Vol. 67 Issue 7, p2960-2965. 6p.

Subject Terms: MAGNETIC tunnelling, ELECTRONIC circuits

Authors: Giering, K.-U.¹ kay-uwe.giering@eas.iis.fraunhofer.de, Puschkarsky, K.² katja.puschkarsky@infineon.com, Reisinger, H.², Rzepa, G.³, Rott, G.², Vollertsen, R.², Grasser, T.³ grasser@iue.tuwien.ac.at, Jancke, R.¹

Superior Title: IEEE Transactions on Electron Devices. Apr2019, Vol. 66 Issue 4, p1662-1668. 7p.

Subject Terms: METAL oxide semiconductor field-effect transistors, ELECTRONIC circuit design, TEMPERATURE measurements, ELECTRIC potential, LOGIC circuits

Authors: Chen, Zhanfei, Sun, Lingling, Liu, Jun, Su, Guodong, Zhou, Wenyong

Superior Title: IEEE Transactions on Electron Devices. Oct2018, Vol. 65 Issue 10, p4232-4237. 6p.

Subject Terms: *INTEGRATED circuits, ELECTRONIC circuits, THERMAL resistance, METAL oxide semiconductor field-effect transistors, THERMAL conductivity

Authors: Zhiwei Chang¹, Lin Meng¹, Yong Yin¹, Bin Wang¹, Hailong Li¹, Rauf, Abdur¹, Ullah, Safi¹, Liangjie Bi¹, Ruibin Peng¹

Superior Title: IEEE Transactions on Electron Devices. Mar2018, Vol. 65 Issue 3, p1179-1184. 6p.

Subject Terms: *ENERGY consumption, ELECTRONIC circuit design, KLYSTRONS, ELECTRIC fields, CIRCUIT stability, LOW voltage systems

Authors: Gao, Rui¹, Ji, Zhigang¹, Manut, Azrif B.¹, Zhang, Jian Fu¹, Zhang, Wei Dong¹, Franco, Jacopo², Kaczer, Ben², Linten, Dimitri², Groeseneken, Guido², Wan Muhamad Hatta, Sharifah³

Superior Title: IEEE Transactions on Electron Devices. Oct2017, Vol. 64 Issue 10, p4011-4017. 7p.

Subject Terms: COMPLEMENTARY metal oxide semiconductors, ELECTRONIC circuit design, HOLE traps (Semiconductors), NANOELECTROMECHANICAL systems, BURST noise

Authors: Jeon, Jongwook¹, Kang, Myounggon²

Superior Title: IEEE Transactions on Electron Devices. Dec2016, Vol. 63 Issue 12, p4674-4677. 4p.

Subject Terms: *MATHEMATICAL optimization, *MATHEMATICAL models, ELECTRONIC circuit design, ELECTRONIC circuits, METAL oxide semiconductor field-effect transistors, NOISY circuits, RADIO frequency, ELECTRIC capacity, COMPLEMENTARY metal oxide semiconductors

Authors: Roul, Basanta, Singh, Deependra Kumar, Chowdhury, Arun Malla, Kumari, Malti, Kumawat, Kishan Lal, Nanda, K. K., Krupanidhi, S. B.

Superior Title: IEEE Transactions on Electron Devices; Aug2022, Vol. 69 Issue 8, p4355-4361, 7p

Subject Terms: PHOTODETECTORS, OPTOELECTRONIC devices, ELECTRONIC circuits, THIN films, BROADBAND communication systems

Authors: Roy, Ananda S.¹, Kim, Sungwon¹, Mudanai, Sivakumar P.¹

Superior Title: IEEE Transactions on Electron Devices. Apr2017, Vol. 64 Issue 4, p1689-1694. 6p.

Subject Terms: PINK noise, ELECTRONIC circuit design equipment, ANALOG circuits -- Design & construction, ELECTRIC capacity, VOLTAGE control

Authors: Huang, Yi¹, Najafizadeh, Laleh¹

Superior Title: IEEE Transactions on Electron Devices. Feb2017, Vol. 64 Issue 2, p392-399. 8p.

Subject Terms: BICMOS logic circuits, TEMPERATURE compensation in electronic circuits, HETEROJUNCTION bipolar transistors, SILICON germanium integrated circuits, BAND gaps

Authors: Zhao, Qinghang¹, Liu, Yongpan¹, Zhao, Jiaqing², Guo, Xiaojun², Li, Hehe¹, Yang, Huazhong¹

Superior Title: IEEE Transactions on Electron Devices. Feb2016, Vol. 63 Issue 2, p684-690. 7p.

Subject Terms: DIGITAL electronics, ELECTRONIC circuits, INTERNET of things, ELECTRONIC structure, WEARABLE technology, LOGIC circuits

Authors: Raghunathan, Uppili S.¹, Chakraborty, Partha S.¹, Bantu, Tikurete G.², Wier, Brian R.¹, Yasuda, Hiroshi³, Menz, Philip⁴, Cressler, John D.¹

Superior Title: IEEE Transactions on Electron Devices. Jul2015, Vol. 62 Issue 7, p2084-2091. 8p.

Subject Terms: IONIZATION energy, ELECTRONIC circuit design software, THERMAL stresses, ELECTRIC resistance

Authors: Porhonen, Juho¹, Rajala, Satu², Lehtimaki, Suvi¹, Tuukkanen, Sampo³

Superior Title: IEEE Transactions on Electron Devices. Sep2014, Vol. 61 Issue 9, p3303-3308. 6p.

Subject Terms: ELECTRONIC circuit design, ENERGY harvesting, SUPERCAPACITORS, SCHOTTKY barrier diodes, PIEZOELECTRIC devices

Authors: Ambrogio, Stefano¹, Balatti, Simone¹, Gilmer, David C.², Ielmini, Daniele¹

Superior Title: IEEE Transactions on Electron Devices. Jul2014, Vol. 61 Issue 7, p2378-2386. 9p.

Subject Terms: SWITCHING circuits, ELECTRONIC circuits, TEMPERATURE, ELECTRIC resistors, CIRCUIT elements

Authors: Hu, Sanming¹, Jin, Cheng², Li, Hongyu¹, Li, Rui¹, Chong, Ser Choong¹, Jong, Ming Chinq¹, Wai, Eva Leong Ching¹, Teo, Keng Hwa¹, Je, Minkyu¹, Lo, Patrick Guo Qiang¹

Superior Title: IEEE Transactions on Electron Devices. Jul2014, Vol. 61 Issue 7, p2584-2587. 4p.

Subject Terms: *INTEGRATED circuits, *MICROELECTRONICS, ELECTRONIC circuits, ELECTRIC circuits, COMPLEMENTARY metal oxide semiconductors

Authors: Sokol, Daniel, Yamada, Minoru, Nulman, Jaim

Superior Title: IEEE Transactions on Electron Devices; Nov2021, Vol. 68 Issue 11, p5747-5752, 6p

Subject Terms: RADIO frequency, STRAY currents, ELECTRONIC circuits, BREAKDOWN voltage, CAPACITORS, ELECTRIC capacity

Authors: Niraula, Madan¹, Yasuda, Kazuhito¹, Namba, Syuhei¹, Kondo, Takaki¹, Muramatsu, Shinya¹, Yamashita, Hayate¹, Wajima, Yuto¹, Agata, Yasunori¹

Superior Title: IEEE Transactions on Electron Devices. Dec2012, Vol. 59 Issue 12, p3450-3455. 6p.

Subject Terms: ELECTRIC circuits, ELECTRONIC circuit design, SPECTROSCOPIC imaging, DIAGNOSTIC imaging, ELECTRONIC circuits

Authors: Chua, Ciersiang¹, Aditya, Sheel²

Superior Title: IEEE Transactions on Electron Devices. Mar2013, Vol. 60 Issue 3, p1251-1256. 6p.

Subject Terms: *DATA transmission systems, *DIGITAL communications, ELECTRONIC circuit design, COMPUTER simulation of electronic circuits, ELECTRON optics, ELECTRON beams