Authors: Mathabathe, Maria Ntsoaki, Bolokang, A.S., Govender, G., Siyasiya, Charles Witness, Mostert, R.J. (Roelf)
Subject Terms: Aluminum alloys, Binary alloys, Chromium alloys, Compaction, Melting, Scanning electron microscopy (SEM), Ternary alloys, Titanium alloys, Vacuum applications, Vacuum technology, Cold pressing, Micro-structural characterization, Orientation mapping, Phase domain, TiAl-based alloys, Vacuum arc melting, Niobium alloys, Electron backscatter diffraction (EBSD), Blackburn orientation relationship (BOR), Energy dispersion spectroscopy (EDS), X-ray diffraction (XRD)
Relation: http://hdl.handle.net/2263/71519; Mathabathe, M.N., Bolokang, A.S., Govender, G. et al. 2019, 'Cold-pressing and vacuum arc melting of γ-TiAl based alloys', Advanced Powder Technology, vol. 30, no. 12, pp. 2925-2939.; 0921-8831 (print); 1568-5527 (online)
Authors: Mathabathe, Maria Ntsoaki, Bolokang, A.S., Govender, S., Mostert, R.J. (Roelf), Siyasiya, Charles Witness
Subject Terms: Scanning electron microscopy (SEM), Oxynitrides, Cyclic oxidation, Vacuum melted, Ti-48Al-2Nb-0.7Cr-0.3Si alloy, Ti-48Al-2Nb alloy, Titanium (Ti), Niobium alloys, Titanium oxynitride, Alumina, Aluminum alloys, Aluminum oxide, Chromium alloys, Oxidation, Silicon alloys, Ternary alloys, Titanium alloys, Vickers hardness, Lower hardness, Nb alloys, Oxide layer, Parent metal, Si alloys
Relation: http://hdl.handle.net/2263/65055; Mathabathe, M.N., Bolokang, A.S., Govender, G. et al. 2018, 'The vacuum melted ɣ-TiAl (Nb, Cr, Si)-doped alloys and their cyclic oxidation properties', Vacuum, vol. 154, pp. 82-89.; 0042-207X (print); 1879-2715 (online)