Authors: Xue Qi-kun, Hasegawa Yukio, Ogino Tsuyoshi, Kiyama Hisashi, Sakurai Toshio
Subject Terms: molecular beam epitaxy, scanning tunneling microscopy, heterojunction, InAs, GaAs
File Description: application/pdf; 1140721 bytes
Relation: https://tohoku.repo.nii.ac.jp/?action=repository_uri&item_id=47249; http://hdl.handle.net/10097/28726; Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy, 44(2), 153-156(1997-03-31); AA00836167; https://tohoku.repo.nii.ac.jp/?action=repository_action_common_download&item_id=47249&item_no=1&attribute_id=18&file_no=1
Authors: Xue Qi Kun, Hashizume Tomihiro, Ichimiya Ayahiko, Ohno Takahisa, Hasegawa Yukio, Sakurai Toshio
Subject Terms: GaAs, scanning tunneling microscopy, molecular beam epitaxy, reflection high energy electron diffraction, first-principles total energy calculation
File Description: application/pdf; 6753302 bytes
Relation: https://tohoku.repo.nii.ac.jp/?action=repository_uri&item_id=47246; http://hdl.handle.net/10097/28723; Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy, 44(2), 113-143(1997-03-31); AA00836167; https://tohoku.repo.nii.ac.jp/?action=repository_action_common_download&item_id=47246&item_no=1&attribute_id=18&file_no=1