Authors: Fiala, K. (Karel), Hernández, L., Holub, P.
Subject Terms: evergreen forests, mangroves, root dry mass, semi-deciduous forests, soil depth
Relation: urn:pissn: 0128-1283; urn:eissn: 0128-1283; http://hdl.handle.net/11104/0299744
Authors: Kreislová, K., Nováková, R., Majtás, D. (Dušan)
Subject Terms: pitting corrosion evaluation, 3D microscopy, depth of pits, aluminium
Relation: urn:isbn: 978-80-87583-11-1; http://hdl.handle.net/11104/0245786
Availability: http://hdl.handle.net/11104/0245786
Authors: Kotík, L. (Lukáš), Hlubinka, D., Vencálek, O.
Subject Terms: data depth, nonparametric multivariate analysis, strong consistency of depth, mixture of distributions
Relation: urn:pissn: 0023-5954; http://hdl.handle.net/11104/0190364
Availability: http://hdl.handle.net/11104/0190364
Authors: Juszczak, R., Humphreys, E., Acosta, M. (Manuel), Michalak-Galczewska, M., Kayzer, D., Olejnik, J. (Janusz)
Subject Terms: Ecosystem respiration, Geogenous peatland, Chamber measurements, CO2 fluxes, Water table depth
Relation: urn:pissn: 0032-079x; urn:eissn: 1573-5036; http://hdl.handle.net/11104/0211169
Authors: Boček, P. (Pavel), Šiman, M. (Miroslav)
Subject Terms: multivariate quantile, regression quantile, halfspace depth, depth contour
Relation: urn:pissn: 0023-5954; http://hdl.handle.net/11104/0273538
Subject Terms: active tectonics, depth fault tracking, shallow trenching, electrical resistivity tomography, Central Europe
Relation: urn:pissn: 1172-2886; urn:eissn: 1172-2886; urn:isbn: 978-1-98-853036-9; http://hdl.handle.net/11104/0282120
Availability: http://hdl.handle.net/11104/0282120
Relation: urn:isbn: 978-5-9274-0780-4; http://hdl.handle.net/11104/0279552
Availability: http://hdl.handle.net/11104/0279552
Authors: Šimeček, M. (Michal), Šikl, R. (Radovan)
Subject Terms: visual perception, visual space perception, depth cues, spatial descriptors, depth compression
Relation: urn:isbn: 978-80-86174-18-1; http://hdl.handle.net/11104/0251349
Availability: http://hdl.handle.net/11104/0251349
Authors: Zahradníček, P. (Pavel), Rožnovský, J., Štěpánek, P. (Petr), Farda, A. (Aleš), Brzezina, J.
Subject Terms: new snow, total snow depth, climate change, climate models
Relation: urn:pissn: 2336-6311; urn:isbn: 978-80-7509-408-7; http://hdl.handle.net/11104/0306070
Availability: http://hdl.handle.net/11104/0306070
Authors: Weiss, Z. (Zdeněk), Vlčák, P.
Subject Terms: GD-OES, titanium, nitrogen, hydrogen, depth profiles, ion implatantion
Relation: urn:pissn: 0267-9477; urn:eissn: 1364-5544; http://hdl.handle.net/11104/0290920
Authors: Fiala, K., Hernandéz, L., Holub, P. (Petr)
Subject Terms: Evergreen forests, mangroves, root dry mass, semi-deciduous forests, soil depth
Relation: urn:pissn: 0128-1283; urn:eissn: 0128-1283; http://hdl.handle.net/11104/0276185
Authors: Šatala, T., Tesař, M. (Miroslav), Hanzelová, M., Bartík, M., Šípek, V. (Václav), Škvarenina, J., Minďáš, J., Waldhauserová, P.D.
Subject Terms: snow water equivalent, snow depth, snow accumulation, snow melting
Relation: urn:pissn: 0006-3088; urn:eissn: 1336-9563; http://hdl.handle.net/11104/0275275
Subject Terms: backscattered electrons, information depth, penetration of electrons
Relation: info:eu-repo/semantics/altIdentifier/pmid/28248420; urn:pissn: 0022-2720; urn:eissn: 1365-2818; http://hdl.handle.net/11104/0273494
Subject Terms: laser welding, plasma plume, light emissions, autocorrelation analysis, weld depth
Relation: urn:pissn: 1042-346x; urn:eissn: 1938-1387; http://hdl.handle.net/11104/0266287
Authors: Mulot, M., Marcisz, K., Grandgirard, L., Lara, E., Kosakyan, A. (Anush), Robroek, B. J. M., Lamentowicz, M., Payne, R. J., Mitchell, E.A.D.
Subject Terms: Body size, protozoa, soil moisture, testate amoebae, water table depth
Relation: info:eu-repo/semantics/altIdentifier/pmid/28231613; urn:pissn: 1066-5234; urn:eissn: 1550-7408; http://hdl.handle.net/11104/0278324
Authors: Hallin, M., Lu, Z., Paindaveine, D., Šiman, M. (Miroslav)
Subject Terms: conditional depth, growth chart, halfspace depth, local bilinear regression, multivariate quantile, quantile regression, regression depth
Relation: urn:pissn: 1350-7265; urn:eissn: 1573-9759; http://hdl.handle.net/11104/0248946
Authors: Uhnevionak, V., Burenkov, A., Strenger, C., Ortiz, G., Mortet, V. (Vincent), Bedel-Pereira, E., Cristiano, F., Bauer, A.J., Pichler, P.
Subject Terms: 4H-SiC MOSFETs, interface traps, bulk traps, depth dependence
Relation: urn:pissn: 0255-5476; urn:isbn: 978-303835478-9; http://hdl.handle.net/11104/0263566
Authors: Artemenko, A. (Anna), Babchenko, O. (Oleg), Kozak, H. (Halyna), Ukraintsev, E. (Egor), Ižák, T. (Tibor), Romanyuk, O. (Olexandr), Potocký, Š. (Štěpán), Kromka, A. (Alexander)
Subject Terms: diamond, depth profiling, XPS, sputtering, Raman
Relation: urn:isbn: 978-80-87294-63-5; http://hdl.handle.net/11104/0253621
Availability: http://hdl.handle.net/11104/0253621
Authors: Mácová, P. (Petra), Ševčík, R. (Radek), Pérez-Estébanez, M. (Marta), Válek, J. (Jan), Viani, A. (Alberto)
Subject Terms: lime mortar, carbonation depth, CaCO3 polymorphs, micro-Raman
Relation: urn:isbn: 978-83-60043-27-1; http://hdl.handle.net/11104/0252022
Availability: http://hdl.handle.net/11104/0252022
Authors: Zahradníček, P. (Pavel), Rožnovský, J., Štěpánek, P. (Petr), Farda, A. (Aleš), Brzezina, J.
Subject Terms: new snow, total snow depth, climate change, climate models, winter recreations
Relation: urn:pissn: 1804-2821; http://hdl.handle.net/11104/0261284
Availability: http://hdl.handle.net/11104/0261284