Authors: Joo, Jin-Ho, Lee, Jihyoung, You, Heecheon, Kang, Jaheon
Contributors: Lee, Jihyoung, You, Heecheon
Subject Terms: FREQUENCY-DOUBLING TECHNOLOGY, STANDARD AUTOMATED PERIMETRY, ACHROMATIC PERIMETRY, MATRIX, GLAUCOMA, DEFECTS, LCD-based Visual Field Testing System, Mean Deviation, Pattern Standard Deviation, Area Under the Receiver Operating Characteristics Curve
Relation: Journal of Korean Medical Science; Medicine, General & Internal; General & Internal Medicine; https://oasis.postech.ac.kr/handle/2014.oak/50908; 30903; Journal of Korean Medical Science, v.33, no.3, pp.36 - 46; ART002310845; 000426328500004; 2-s2.0-85041099200
Contributors: Lee, S.J
Subject Terms: 4D phase-contrast magnetic resonance imaging, Turbulent kinetic energy, Stenotic flow, Intravoxel standard deviation, STENOTIC JETS, BLOOD-FLOW, VELOCITY, QUANTIFICATION, STENOSIS, NOISE
Relation: MAGNETIC RESONANCE IMAGING; Radiology, Nuclear Medicine & Medical Imaging; https://oasis.postech.ac.kr/handle/2014.oak/37211; 23316; MAGNETIC RESONANCE IMAGING, v.34, no.6, pp.715 - 723; 000377640500002; 2-s2.0-84962744729
Authors: Song, Kyu Chan, Ranbir Singh, Lee, Jaewon, Sin, Dong Hun, Lee, Hansol, Cho, Kilwon
Contributors: Ranbir Singh, Cho, Kilwon
Subject Terms: MONITORING PROCESS DISPERSION, SYNTHETIC CONTROL CHART, EWMA CONTROL CHART, STANDARD-DEVIATION, MOVING AVERAGE, X-CHART, DESIGNS
Relation: Journal of Materials Chemistry C; Materials Science, Multidisciplinary; Physics, Applied; Materials Science; Physics; https://oasis.postech.ac.kr/handle/2014.oak/92168; 27078; Journal of Materials Chemistry C, v.4, no.45, pp.10610 - 10615; 000388987900003; 2-s2.0-84996835511
Contributors: Kang, BS, Kang, MS, Kim, KT
Subject Terms: MONITORING PROCESS DISPERSION, SYNTHETIC CONTROL CHART, EWMA CONTROL CHART, STANDARD-DEVIATION, MOVING AVERAGE, X-CHART, DESIGNS
Relation: IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS; Engineering, Aerospace; Engineering, Electrical & Electronic; Telecommunications; Engineering; https://oasis.postech.ac.kr/handle/2014.oak/37962; 19448; IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS, v.52, no.3, pp.1454 - U554; 000380113800038; 2-s2.0-84997785021
Contributors: Jun, CH
Subject Terms: MONITORING PROCESS DISPERSION, SYNTHETIC CONTROL CHART, EWMA CONTROL CHART, STANDARD-DEVIATION, MOVING AVERAGE, X-CHART, DESIGNS, Variable sample size, multiple dependent state sampling, Monte Carlo simulation, average run length
Relation: Journal of Statistical Computation and Simulation; Computer Science, Interdisciplinary Applications; Statistics & Probability; Computer Science; Mathematics; https://oasis.postech.ac.kr/handle/2014.oak/37037; 19290; Journal of Statistical Computation and Simulation, v.86, no.18, pp.3620 - 3628; 000384405900003; 2-s2.0-84965064262
Contributors: Jun, CH
Subject Terms: S CONTROL CHARTS, STANDARD-DEVIATION, DESIGN, DISPERSION, repetitive sampling, control chart, average run length, process shift
Relation: JOURNAL OF APPLIED STATISTICS; Statistics & Probability; Mathematics; https://oasis.postech.ac.kr/handle/2014.oak/36327; 18077; JOURNAL OF APPLIED STATISTICS, v.42, no.11, pp.2485 - 2496; 000361468900014; 2-s2.0-84941997320