Authors: Liu, K. Y., Wang, S. T., Hwang, C. C., Kuo, C. H.
Contributors: 交大名義發表, National Chiao Tung University
Relation: http://hdl.handle.net/11536/153314; MAINTENANCE, SAFETY, RISK, MANAGEMENT AND LIFE-CYCLE PERFORMANCE OF BRIDGES; WOS:000494642700165
Availability: http://hdl.handle.net/11536/153314
Authors: Zhong, C. W., Tsai, H. Y., Lin, H. C., Liu, K. C., Huang, T. Y.
Contributors: 電機學院, 電子工程學系及電子研究所, College of Electrical and Computer Engineering, Department of Electronics Engineering and Institute of Electronics
Relation: http://hdl.handle.net/11536/136098; PROCEEDINGS OF THE 22ND INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA 2015); WOS:000380466200024
Availability: http://hdl.handle.net/11536/136098
Authors: Azarm, A., Song, D., Liu, K., Hosseini, S., Teranishi, Y., Lin, S. H., Xia, A., Kong, F., Chin, S. L.
Contributors: 應用化學系分子科學碩博班, Institute of Molecular science
Relation: http://dx.doi.org/10.1088/0953-4075/44/8/085601; http://hdl.handle.net/11536/8985; JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS; WOS:000289411700011
Authors: Liu, K. M., Umansky, V., Hsu, S. Y.
Contributors: 電子物理學系, Department of Electrophysics
Relation: http://dx.doi.org/10.1103/PhysRevB.81.235316; http://hdl.handle.net/11536/5269; PHYSICAL REVIEW B; WOS:000278710700001
Authors: Liu, K. M., Juang, C. H., Umansky, V., Hsu, S. Y.
Contributors: 電子物理學系, Department of Electrophysics
Relation: http://dx.doi.org/10.1088/0953-8984/22/39/395303; http://hdl.handle.net/11536/150031; JOURNAL OF PHYSICS-CONDENSED MATTER; WOS:000281958500014
Authors: Liu, K. M., Juang, C. H., Umansky, V., Hsu, S. Y.
Contributors: 電子物理學系, Department of Electrophysics
Relation: http://dx.doi.org/10.1088/0953-8984/22/39/395303; http://hdl.handle.net/11536/32083; JOURNAL OF PHYSICS-CONDENSED MATTER
Authors: Tang, H. -L., Chiang, M. -K., Liou, W. -J., Chen, Y. -T., Peng, H. -L., Chiou, C. -S., Liu, K. -S., Lu, M. -C., Tung, K. -C., Lai, Y. -C.
Contributors: 生物科技學系, Department of Biological Science and Technology
Relation: http://dx.doi.org/10.1007/s10096-010-0915-1; http://hdl.handle.net/11536/5338; EUROPEAN JOURNAL OF CLINICAL MICROBIOLOGY & INFECTIOUS DISEASES
Authors: Hsiao, J. H., Liu, K. M., Hsu, S. Y., Hong, T. M.
Contributors: 電子物理學系, Department of Electrophysics
Subject Terms: Coulomb blockade, Kondo effect, quantum dots, quantum point contacts, resonant tunnelling
Relation: http://dx.doi.org/10.1103/PhysRevB.79.033304; http://hdl.handle.net/11536/7774; PHYSICAL REVIEW B; WOS:000262978200020
Authors: Liu, K. M., Hsiao, J. H., Hong, T. M., Umansky, V., Hsu, S. Y.
Contributors: 電子物理學系, Department of Electrophysics
Relation: http://hdl.handle.net/11536/13245; http://dx.doi.org/10.1088/1742-6596/150/2/022052; 25TH INTERNATIONAL CONFERENCE ON LOW TEMPERATURE PHYSICS (LT25), PART 2; WOS:000277052700053
Authors: Wu, C. -W., Shu, M. H., Pearn, W. L., Liu, K. H.
Contributors: 工業工程與管理學系, Department of Industrial Engineering and Management
Subject Terms: bootstrap resampling, error probability, lower confidence bound, production yield, supplier selection
Relation: http://hdl.handle.net/11536/9963; http://dx.doi.org/10.1080/00207540701278414; INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH; WOS:000259100300012
Authors: Cheng, C.-Y., Perevedentseva, E., Tu, J.-S., Chung, P.-H., Cheng, C.-L., Liu, K.-K., Chao, J.-I., Chen, P.-H., Chang, C.-C.
Contributors: 生物科技學系, Department of Biological Science and Technology
Relation: http://dx.doi.org/10.1063/1.2727557; http://hdl.handle.net/11536/10893; APPLIED PHYSICS LETTERS
Authors: Chang, K. M., Tzeng, W. H., Liu, K. C., Chan, Y. C., Kuo, C. C.
Contributors: 電子工程學系及電子研究所, Department of Electronics Engineering and Institute of Electronics
Relation: http://hdl.handle.net/11536/20363; http://dx.doi.org/10.1149/1.3569906; DIELECTRICS IN NANOSYSTEMS -AND- GRAPHENE, GE/III-V, NANOWIRES AND EMERGING MATERIALS FOR POST-CMOS APPLICATIONS 3; WOS:000309539300011
Authors: Chang, K. M., Tzeng, W. H., Liu, K. C., Lai, W. R.
Contributors: 電子工程學系及電子研究所, Department of Electronics Engineering and Institute of Electronics
Relation: http://hdl.handle.net/11536/20989; http://dx.doi.org/10.1149/1.3372569; DIELECTRICS FOR NANOSYSTEMS 4: MATERIALS SCIENCE, PROCESSING, RELIABILITY, AND MANUFACTURING; WOS:000313250400010
Authors: Wang, S. Y., Chou, C. L., Liu, K. C., Ho, T. W., Hung, W. J., Huang, C. F., Hsu, M. S., Chen, H. Y., Lin, C. C.
Contributors: 資訊工程學系, Department of Computer Science
Relation: http://hdl.handle.net/11536/17935; 2009 IEEE WIRELESS COMMUNICATIONS & NETWORKING CONFERENCE, VOLS 1-5
Availability: http://hdl.handle.net/11536/17935
Authors: Chao, J. I., Liao, W. S., Lin, Y. W., Lin, J., Cheng, H. C., Wang, C. C., Liu, K. K., Li, Y., Chen, C.
Contributors: 生物科技學系, 分子醫學與生物工程研究所, Department of Biological Science and Technology, Institute of Molecular Medicine and Bioengineering
Relation: http://hdl.handle.net/11536/133281; MOLECULAR BIOLOGY OF THE CELL; WOS:000209928401076
Availability: http://hdl.handle.net/11536/133281
Authors: Chao, J. I., Liao, W. S., Lin, Y. W., Lin, J., Cheng, H. C., Wang, C. C., Liu, K. K., Li, Y., Chen, C.
Contributors: 生物科技學系, 分子醫學與生物工程研究所, Department of Biological Science and Technology, Institute of Molecular Medicine and Bioengineering
Relation: http://hdl.handle.net/11536/133354; MOLECULAR BIOLOGY OF THE CELL; WOS:000209928401076
Availability: http://hdl.handle.net/11536/133354
Authors: Liu, K. M., Lin, H. I., Umansky, V., Hsu, S. Y.
Contributors: 電子物理學系, Department of Electrophysics
Subject Terms: Quantum point contacts in series, Transmission probability, Adiabatic transport, Ohmic transport
Relation: http://dx.doi.org/10.1016/j.physe.2009.11.094; http://hdl.handle.net/11536/12456; PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES