Authors: Wang, H, Ng, SM, Wong, HF, Wong, WC, Lam, KK, Liu, YK, Fei, LF, Zhou, YB, Mak, CL, Wang, Y, Leung, CW
Contributors: Department of Applied Physics
Subject Terms: Post-annealing, Pulsed laser deposition, Raman spectroscopy, WS2
Relation: http://hdl.handle.net/10397/100349; 239; 242; 152; 2-s2.0-85044471727; AP-0501
Contributors: Department of Applied Physics
Subject Terms: Exchange bias effect, Perovskite oxide thin films, Pulsed laser deposition
Relation: http://hdl.handle.net/10397/100228; 175; 2-s2.0-85079843398; 109280; AP-0191
Authors: Gong, X, Feng, M, Wu, H, Zhou, H, Suen, C, Zou, H, Guo, L, Zhou, K, Chen, S, Dai, J, Wang, G, Zhou, X
Contributors: Department of Applied Physics
Subject Terms: Angle-resolved polarized Raman spectra, Pulsed laser deposition, SnSe, Thermal annealing, Thin films
Relation: http://hdl.handle.net/10397/95709; 535; 2-s2.0-85090198942; 147694; AP-0086
Authors: Luo, Y, Tang, Z, Yin, X, Chen, C, Fan, Z, Qin, M, Zeng, M, Zhou, G, Gao, X, Lu, X, Dai, J, Chen, D, Liu, JM
Contributors: Department of Applied Physics
Subject Terms: Ferroelectricity, Hafnium oxide, Orthorhombic phase, Pulsed laser deposition
Relation: http://hdl.handle.net/10397/95062; 311; 318; 2-s2.0-85117164039; CDCF_2021-2022
Contributors: Department of Applied Physics
Subject Terms: High mobility, Large magnetoresistance, Linear magnetoresistance, Pulsed-laser deposition, Topological material, ZrTe2 thin film
Relation: http://hdl.handle.net/10397/100291; 6008; 6016; 13; 2-s2.0-85065584097; AP-0339
Contributors: Department of Applied Physics
Subject Terms: Ferroelectricity, Pulsed laser deposition, Sr0.5Ba0.5Nb2O6
Relation: http://hdl.handle.net/10397/100297; 216; 2-s2.0-85059251109; 1800660; AP-0354
Contributors: Department of Applied Physics, Mainland Development Office
Subject Terms: InSe, Monolayer, Photoresponse, Pulsed laser deposition, Wafer-scale synthesis
Relation: http://hdl.handle.net/10397/95309; 4225; 4236; 11; 2-s2.0-85018628481; RGC-B2-0523, AP-0665; 6742890
Contributors: Department of Applied Physics
Subject Terms: Ferroelectric tunnel junctions, Graphene-based devices, Pulsed laser deposition, Tunneling electroresistance effect, Two-dimensional materials
Relation: http://hdl.handle.net/10397/95252; 12; 2-s2.0-85052992082; 1800205; RGC-B2-1108
Contributors: Department of Applied Physics
Subject Terms: Barium compounds, Energy gap, Epitaxial layers, Grain size, Internal stresses, Neodymium, Photoluminescence, Pulsed laser deposition, Raman spectra, Strontium compounds, X-ray diffraction
Relation: 2158-3226 (online); http://hdl.handle.net/10397/4578; 10; WOS:000302139600072; 2-s2.0-80053550015; r60501; OA_IR/PIRA
Contributors: Department of Applied Physics
Subject Terms: Graphene, Nondestructive testing, Pulsed laser deposition, Raman spectra, Transmission electron microscopy
Relation: 2158-3226 (online); http://hdl.handle.net/10397/4424; WOS:000302137000039; 2-s2.0-80052796464; r53509; OA_IR/PIRA
Contributors: Department of Applied Physics
Subject Terms: 2D materials, Ferroelectric thin films, Field-effect transistors, Graphene, Pulsed laser deposition
Relation: http://hdl.handle.net/10397/65598; 10048; 10054; 28; 45; WOS:000392725200017; 2-s2.0-84999751990; AP-0822; 6700714
Contributors: Department of Applied Physics
Subject Terms: Pulsed laser deposition, BST thin film, Heterostructure, dielectric tunability, Figure of merit
Relation: http://hdl.handle.net/10397/63790; 80; 86; 29; r32794; OA_IR/PIRA
Availability: http://hdl.handle.net/10397/63790
Contributors: Department of Applied Physics
Subject Terms: Epitaxial growth, Magnesia, Morphology, Pulsed laser deposition, Sol-gels, Strontium compounds, Substrates
Relation: http://hdl.handle.net/10397/6917; 3179; 3183; 16; 11; WOS:000172020600025; r05988; OA_IR/PIRA
Contributors: Department of Applied Physics
Subject Terms: Barium compounds, Electrical conductivity transitions, Electrical resistivity, Epitaxial layers, Molecular beam epitaxial growth, Nanocomposites, Nanofabrication, Nanoparticles, Pulsed laser deposition, Silver
Relation: http://hdl.handle.net/10397/5868; 114; WOS:000321761600083; 2-s2.0-84880345552; r68214; OA_IR/PIRA
Contributors: Department of Applied Physics
Subject Terms: Barium compounds, Buffer layers, Curie temperature, Epitaxial layers, Ferroelectric thin films, Molecular beam epitaxial growth, Permittivity, Pulsed laser deposition, Strontium compounds
Relation: http://hdl.handle.net/10397/6237; 112; WOS:000309072200111; 2-s2.0-84866428985; r66914; OA_IR/PIRA
Contributors: Department of Applied Physics, Materials Research Centre
Subject Terms: Lanthanum compounds, Strontium compounds, Pulsed laser deposition, Atomic force microscopy, X-ray diffraction, Electrical resistivity, Vapour phase epitaxial growth, Vacuum deposition
Relation: http://hdl.handle.net/10397/4979; 700; 704; 88; WOS:000087889800016; 2-s2.0-0142111491; r03179; OA_IR/PIRA
Contributors: Department of Applied Physics
Subject Terms: Lead compounds, Lanthanum compounds, Pulsed laser deposition, Ferroelectric materials, Ferroelectric thin films, Field effect transistors, Dielectric polarisation
Relation: http://hdl.handle.net/10397/4980; 2068; 2071; 88; WOS:000088783800060; 2-s2.0-0000330028; r03178; OA_IR/PIRA
Contributors: Department of Applied Physics, Materials Research Centre
Subject Terms: Lanthanum compounds, Neodymium compounds, Strontium compounds, Colossal magnetoresistance, Magnetic epitaxial layers, Annealing, Pulsed laser deposition, Grain boundaries
Relation: http://hdl.handle.net/10397/4974; 3006; 3010; 87; WOS:000085531400052; 2-s2.0-0001737024; OA_IR/PIRA
Contributors: Department of Applied Physics
Subject Terms: Amorphous magnetic materials, Amorphous semiconductors, Carrier density, Electric admittance, Ferromagnetic materials, Frustration, Germanium compounds, Iron compounds, Magnetic thin films, Magnetisation, Phase change materials, Pulsed laser deposition, RKKY interaction, Semiconductor growth, Semiconductor thin films, Semimagnetic semiconductors, Short-range order
Relation: http://hdl.handle.net/10397/4574; 99; WOS:000294359100020; 2-s2.0-80052401108; r57142; OA_IR/PIRA
Contributors: Department of Applied Physics
Subject Terms: Atomic force microscopy, Pulsed laser deposition, Scanning electron microscopy, X ray diffraction, Film, Optics
Relation: http://hdl.handle.net/10397/4787; 69; 14; WOS:000221426200028; 2-s2.0-37649031584; r16482; OA_IR/PIRA