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5
Report

File Description: application/pdf

Relation: Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1997; Solid State Physics, Electronics and Optics; Materials and Fabrication; Compound Semiconductor Materials and Devices; Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 140; RLE_PR_140_01_01s_01; http://hdl.handle.net/1721.1/57412

6
Report

File Description: application/pdf

Relation: Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1995; Solid State Physics, Electronics and Optics; Materials and Fabrication; Gas Source Molecular Beam Epitaxy of Compound Semiconductors; Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 138; RLE_PR_138_01_01s_03; http://hdl.handle.net/1721.1/57322

7
Report

Subject Terms: Heterostructures for High Performance Devices, Computer Controlled Growth of Lattice-Matched InGaAIAs Heterostructures on InP, InGaAIAs Strained-Layer Heterostructures on 111 GaAs for Optoelectronic Device Applications, InGaAIAs Strained-Layer Heterostructures on InP for Optoelectronic Device Applications, Molecular Beam Epitaxy of GaAIAs Laser Diode Heterostructures on Silicon Substrates, Integration of Vertical Cavity Surface Emitting Lasers on GaAs Integrated Circuits, MBE-Grown InGaAIAs/InP Long-Wavelength Laser Diodes for Narrow Linewidth Applications, Applications for New Three Terminal Laser Diodes with Dynamic Control of Gain Index, Applications for New Three Terminal Laser Diodes with Dynamic Control of Refractive Index, Use of Graded Profiles to Improve InGaAIAs/InP Heterojunction Bipolar Transistor Performance, Applications of Delta-Doping to Heterojunction Bipolar Transistors, Microwave Characterization of Emitter-Down Heterojunction Bipolar Transistors, Microwave Analysis of Emitter-Down Heterojunction Bipolar Transistors, Microwave Modeling of Emitter-Down Heterojunction Bipolar Transistors, AlAs Etch-Stop Layers for InGaAIAs/InP Heterostructure Devices, AlAs Etch-Stop Layers for InGaAIAs/InP Heterostructure Circuits, Three-Terminal n-n-n Quantum-Well-Base, Tunnel-Barrier Devices, Self-Consistent Modeling of Biased Quantum-Well-Base, Tunnel-Barrier Structures, Infrared Characterization of InGaAs/AIAs/InP Quantum Well Heterostructures, Damage-Free In-Situ UHV Etching of III-V Heterostructures Using Molecular Beams, Damage-Free In-Situ UHV Cleaning of III-V Heterostructures Using Molecular Beams, Publications

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Relation: Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1990; Solid State Physics, Electronics and Optics; Materials and Fabrication; Heterostructures for High Performance Devices; Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 133; RLE_PR_133_01_01s_09; http://hdl.handle.net/1721.1/57158

8
Report

File Description: application/pdf

Relation: Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1996; Solid State Physics, Electronics and Optics; Materials and Fabrication; Compound Semiconductor Materials and Devices; Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 139; RLE_PR_139_01_01s_01; http://hdl.handle.net/1721.1/57392

9
Report

File Description: application/pdf

Relation: Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1995; Solid State Physics, Electronics and Optics; Materials and Fabrication; Compound Semiconductor Materials and Devices; Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 138; RLE_PR_138_01_01s_01; http://hdl.handle.net/1721.1/57353

10
Report

Subject Terms: Heterostructures for High-Performance Devices, High-Temperature Stability of GaAs Integrated Circuits, High Peak-to-Valley Current Ratio Resonant-Tunneling Diodes on GaAs Substrates, Monolithic Integration of Resonant-Tunneling Diodes on GaAs Integrated Circuits, Phosphide-Based Optical Emitters for Monolithic Integration with GaAs MESFETS, Monolithic Integration of LEDs and VLSI GaAs MESFET Circuits, Development of an Epi-on-Electronics OEIC Technology, Integrated Optics Circuits Based on Commercial GaAs Integrated Circuits, Growth of Distributed Bragg Reflector at Reduced Temperature, Growth of Multiple Quantum Well Heterostructures at Reduced Temperature, Reactive Ion Etching of InGaAIAs Heterostructures, Reactive Ion Etching of InGaAsP Heterostructures, Tunable Semiconductor Lasers, Application of the Spectral Index Method to Laser Diode Design, Normal Incidence Quantum Well Infrared Photodetector, Fourteen-Band k * p Analysis of Intersubband Transitions in Conduction Band Quantum Wells, Intersubband Transitions in Ultra-Narrow Quantum Wells, In-plane Field Magneto-Tunneling Spectroscopy in Double InGaAs/InAIAs Quantum Well Structures on [001] InP Substrates, Tilted Field Magneto-Tunneling Spectroscopy in Double InGaAs/InAIAs Quantum Well Structures on [001] InP Substrates, In-plane Field Magneto-Tunneling Spectroscopy in Double InGaAs/InAIAs Quantum Well Structures on [111]B InP Substrates, Tilted Field Magneto-Tunneling Spectroscopy in Double InGaAs/InAIAs Quantum Well Structures on [111]B InP Substrates, High-Frequency/High-Speed Characterization of Optoelectronic Devices, High-Frequency/High-Speed Characterization of Integrated Circuits, In-Situ Supersonic Beam Etching of III-V Heterostructures

File Description: application/pdf

Relation: Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1994; Solid State Physics, Electronics and Optics; Materials and Fabrication; Heterostructures for High-Performance Devices; Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 137; RLE_PR_137_01_01s_01; http://hdl.handle.net/1721.1/57295

11
Report

File Description: application/pdf

Relation: Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1991; Solid State Physics, Electronics and Optics; Optics and Devices; Optics and Quantum Electronics; Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 134; RLE_PR_134_01_03s_01; http://hdl.handle.net/1721.1/57189

12
Report

Subject Terms: Heterostructures for High Performance Devices, Computer Controlled Growth of Lattice-Matched InGaAIAs Heterostructures on InP, Molecular Beam Epitaxy of InGaAIAs Strained-Layer Heterostructures on 111 GaAs, Molecular Beam Epitaxy of InGaAIAs Strained-Layer Heterostructures on InP, Monolithic Fabrication of Strain-free GaAIAs Laser Diodes on Silicon Substrates, Integration of Vertical Cavity Surface Emitting Lasers on GaAs Integrated Circuits, Low Temperature Growth of GaAIAs Laser Diodes, MBE-Grown InGaAIAs/InP Long-Wavelength Laser Diodes for Narrow Linewidth Applications, New Three-Terminal Independently Addressable Asymmetric Laser Diodes (IAADQW-LD) with Dynamic Control of Gain and Refractive Index, Design of Distributed Feedback (DFB) InGaAIAs Laser Diodes Grown by Molecular Beam Epitaxy, Fabrication of Distributed Feedback (DFB) InGaAIAs Laser Diodes Grown by Molecular Beam Epitaxy, Laser Diode Modeling for Narrow Linewidth Operation, Laser Diode Design for Narrow Linewidth Operation, Growth of Improved InGaAIAs/InP Heterojunction Bipolar Transistors, Processing of Improved InGaAIAs/InP Heterojunction Bipolar Transistors, Microwave Characterization of Emitter-Down Heterojunction Bipolar Transistors, Microwave Analysis of Emitter-Down Heterojunction Bipolar Transistors, Microwave Modeling of Emitter-Down Heterojunction Bipolar Transistors, Analysis of Three-Terminal n-n-n Quantum Well Base, Tunnel-Barrier Transistors, Applications of AlAs Etch-Stop Layers in InGaAIAs/InP Heterostructure Electronics, Applications of AlAs Etch-Stop Layers in InGaAIAs/InP Heterostructure Optoelectronics, Electrical Transport Studies in Directly Contacted InGaAs Quantum Wells, Investigation of Infrared Intersubband Emission from InGaAs/AIAs/InP Quantum Well Heterostructures, Investigation of Intersubband Relaxation Times in InGaAIAs Quantum Well Heterostructures, Infrared Characterization of InGaAs/AIAs/InP Quantum Well Heterostructures, Damage-Free In-Situ UHV Etching of III-V Heterostructures Using Molecular Beams, Damage-Free In-Situ UHV Cleaning of III-V Heterostructures Using Molecular Beams

File Description: application/pdf

Relation: Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1991; Solid State Physics, Electronics and Optics; Materials and Fabrication; Heterostructures for High Performance Devices; Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 134; RLE_PR_134_01_01s_01; http://hdl.handle.net/1721.1/57191

13
Dissertation/ Thesis

Contributors: Cardinal Warde., Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.

File Description: 570 p.; 30025702 bytes; 30025461 bytes; application/pdf

14
Dissertation/ Thesis

Contributors: Robert W. Mann., Massachusetts Institute of Technology. Dept. of Mechanical Engineering.

File Description: 2 vol. (792 [i.e. 751] p.); 33823923 bytes; 33823681 bytes; application/pdf

15
Dissertation/ Thesis

Contributors: Walter H. Olson., Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.

File Description: [1], 40 leaves; 3259144 bytes; 3258906 bytes; application/pdf