Authors: Oh, Tae-Sik, Tokpanov, Yury S., Hao, Yong, Jung, WooChul, Haile, Sossina M.
Superior Title: Journal of Applied Physics, 112(10), Art. No. 103535, (2012-11-15)
Subject Terms: cerium compounds, chemical vapour deposition, crystal microstructure, doping, porosity, porous materials, pulsed laser deposition, refractive index, samarium, thin films, ultraviolet spectra, visible spectra
Relation: https://doi.org/10.1063/1.4766928; oai:authors.library.caltech.edu:wk6vb-zk005; eprintid:36140; resolverid:CaltechAUTHORS:20130103-094855552
Availability: https://doi.org/10.1063/1.4766928
Authors: Kim, Il-Doo, Avrahami, Ytshak, Tuller, Harry L., Park, Young-Bae, Dicken, Matthew J., Atwater, Harry A.
Superior Title: Applied Physics Letters, 86(19), Art. No. 192907, (2005-05-09)
Subject Terms: barium compounds, ferroelectric thin films, piezoelectric materials, piezoelectric thin films, pulsed laser deposition, atomic force microscopy, X-ray diffraction, reflection high energy electron diffraction, dielectric polarisation, piezoelectricity, dielectric hysteresis
Relation: https://doi.org/10.1063/1.1923173; oai:authors.library.caltech.edu:2jeh9-4wn97; eprintid:3471; resolverid:CaltechAUTHORS:KIMapl05
Availability: https://doi.org/10.1063/1.1923173
Authors: Preisler, E. J., Brooke, J., Oldham, N. C., McGill, T. C.
Superior Title: Journal of Vacuum Science and Technology B, 21(4), 1745-1748, (2003-07)
Subject Terms: iron compounds, gallium arsenide, III-V semiconductors, indium compounds, pulsed laser deposition, X-ray photoelectron spectra, electron spin polarisation, reflection high energy electron diffraction, epitaxial layers, interface structure
Relation: https://doi.org/10.1116/1.1588648; oai:authors.library.caltech.edu:4b580-y8868; eprintid:2343; resolverid:CaltechAUTHORS:PREjvstb03
Availability: https://doi.org/10.1116/1.1588648
Superior Title: Applied Physics Letters, 75(26), 4091-4093, (1999-12-27)
Subject Terms: vapour deposition, pulsed laser deposition, surface structure, surface diffusion, surface topography, thin films
Relation: https://doi.org/10.1063/1.125546; oai:authors.library.caltech.edu:7475g-m4714; eprintid:8548; resolverid:CaltechAUTHORS:MAYapl99
Availability: https://doi.org/10.1063/1.125546