Authors: Kitichotkul, Ruangrawee, Rapp, Joshua, Goyal, Vivek K.
Subject Terms: Optical physics, Quantum physics, Electrical and electronic engineering, Optoelectronics & photonics, Electrical engineering, 4009 Electronics, sensors and digital hardware, Atomic, molecular and optical physics
File Description: p. 1-14
Relation: IEEE Journal of Selected Topics in Quantum Electronics; http://dx.doi.org/10.1109/jstqe.2023.3333834; R. Kitichotkul, J. Rapp, V.K. Goyal. 2024. "The Role of Detection Times in Reflectivity Estimation With Single-Photon Lidar" IEEE Journal of Selected Topics in Quantum Electronics, Volume 30, Issue 1: Single-Photon Technologies, pp.1-14. https://doi.org/10.1109/jstqe.2023.3333834; https://hdl.handle.net/2144/48716; 0009-0001-8084-0071 (Kitichotkul, Ruangrawee); 0000-0001-9171-1358 (Rapp, Joshua); 0000-0001-8471-7049 (Goyal, Vivek K); 902703
Authors: Wilson, Robert E., Sonsthagen, Sarah A., DaCosta, Jeffrey M., Sorenson, Michael D., Fox, Anthony D., Weaver, Melanie, Skalos, Dan, Kondratyev, Alexander V., Scribner, Kim T., Walsh, Alyn, Ely, Craig R., Talbot, Sandra L.
Subject Terms: Anser albifrons, Gene flow, Greater white-fronted goose, Circumpolar distribution, Connectivity, Migratory flyway, Population structure, Analytical chemistry, Environmental science and management, Ecology, Distributed computing, Electrical and electronic engineering, Electrical engineering, Electronics, sensors and digital hardware, Environmental management, Distributed computing and systems software
File Description: p. 1067
Relation: Diversity; https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000902614800001&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=6e74115fe3da270499c3d65c9b17d654; http://dx.doi.org/10.3390/d14121067; R.E. Wilson, S.A. Sonsthagen, J.M. DaCosta, M.D. Sorenson, A.D. Fox, M. Weaver, D. Skalos, A.V. Kondratyev, K.T. Scribner, A. Walsh, C.R. Ely, S.L. Talbot. 2022. "As the Goose Flies: Migration Routes and Timing Influence Patterns of Genetic Diversity in a Circumpolar Migratory Herbivore" Diversity, Volume 14, Issue 12, pp.1067-1067. https://doi.org/10.3390/d14121067; https://hdl.handle.net/2144/48516; 0000-0003-1800-0183 (Wilson, Robert E); 0000-0002-8590-2083 (DaCosta, Jeffrey M); 0000-0001-5375-2917 (Sorenson, Michael D); 0000-0001-8083-7633 (Fox, Anthony D); 0000-0003-3416-2828 (Scribner, Kim T); 769595
Authors: Chiodi, Elisa, Daaboul, George G., Marn, Allison M., Ünlü, M Selim
Subject Terms: EVs detection, Extracellular vesicles (EVs), Interferometric imaging, Label-free biosensor, Microarray, Analytical chemistry, Environmental science and management, Ecology, Distributed computing, Electrical and electronic engineering, Electrical engineering, Electronics, sensors and digital hardware, Environmental management, Distributed computing and systems software, Antibodies, Extracellular vesicles, Interferometry, Kinetics, Staining and labeling
Subject Geographic: Switzerland
File Description: 2634-; Electronic
Relation: Diversity; https://www.ncbi.nlm.nih.gov/pubmed/33918613; http://dx.doi.org/10.3390/s21082634; E. Chiodi, G.G. Daaboul, A.M. Marn, M.S. Ünlü. 2021. "Multiplexed Affinity Measurements of Extracellular Vesicles Binding Kinetics." Diversity, Volume 21, Issue 8, pp.2634-. https://doi.org/10.3390/s21082634; https://hdl.handle.net/2144/46882; 0000-0003-2036-4584 (Chiodi, Elisa); 0000-0001-8228-2678 (Marn, Allison M); 0000-0002-8594-892X (Ünlü, M Selim); 627255
Authors: Kag, Anil
Contributors: Saligrama, Venkatesh
Subject Terms: Electrical engineering, Distilling selective / scaffolded knowledge, Distributionally constrained learning, Forward propagation through time, Hybrid edge cloud models, Ordinary differential equation neural layers, Selective classification
Relation: https://hdl.handle.net/2144/46649; orcid:0000-0001-7935-6912
Availability: https://hdl.handle.net/2144/46649
Authors: Cheng, Shiyi
Contributors: Tian, Lei
Subject Terms: Electrical engineering, Computational imaging, Computer vision, Deep learning, Digital staining, Label-free imaging
Relation: https://hdl.handle.net/2144/46634; orcid:0000-0001-5618-5188
Availability: https://hdl.handle.net/2144/46634
Authors: Sui, Yuan
Contributors: Bigio, Irving J.
Subject Terms: Electrical engineering
Relation: https://hdl.handle.net/2144/46264; orcid:0009-0000-3521-1295
Availability: https://hdl.handle.net/2144/46264
Authors: Cilingir Eris, H. Kubra
Contributors: Kulis, Brian
Subject Terms: Electrical engineering
Relation: https://hdl.handle.net/2144/45095
Availability: https://hdl.handle.net/2144/45095
Authors: Chen, Yuyao
Contributors: Dal Negro, Luca
Subject Terms: Electrical engineering, Diffractive optics, Machine learning, Nanophotonics
Relation: https://hdl.handle.net/2144/45089; orcid:0000-0001-6458-1412
Availability: https://hdl.handle.net/2144/45089
Authors: Ma, Qianqian
Contributors: Olshevsky, Alexander
Subject Terms: Electrical engineering, Compartmental model, Epidemic
Relation: https://hdl.handle.net/2144/45050; orcid:0000-0002-0238-1287
Availability: https://hdl.handle.net/2144/45050
Authors: Manjunath, Shashank
Contributors: Ünlü, M. Selim
Subject Terms: Electrical engineering
Relation: https://hdl.handle.net/2144/44776; orcid:0000-0003-3962-3689
Availability: https://hdl.handle.net/2144/44776
Authors: Chiodi, Elisa
Contributors: Ünlü, M. Selim
Subject Terms: Electrical engineering, Biosensing, Interferometry, Label-free, Optical microscopy
Relation: https://hdl.handle.net/2144/44707; orcid:0000-0003-2036-4584
Availability: https://hdl.handle.net/2144/44707
Authors: Gangrade, Aditya
Contributors: Nazer, Bobak, Saligrama, Venkatesh
Subject Terms: Electrical engineering
Relation: https://hdl.handle.net/2144/43708; orcid:0000-0002-0808-913X
Availability: https://hdl.handle.net/2144/43708
Authors: Tezcan, M. Ozan
Contributors: Konrad, Janusz
Subject Terms: Electrical engineering
Relation: https://hdl.handle.net/2144/43111; orcid:0000-0002-1712-2528
Availability: https://hdl.handle.net/2144/43111
Authors: Matlock, Alex
Contributors: Tian, Lei, Ünlü, M. Selim
Subject Terms: Electrical engineering
Relation: https://hdl.handle.net/2144/43090; orcid:0000-0002-4337-2715
Availability: https://hdl.handle.net/2144/43090
Authors: Marn, Allison M.
Contributors: Ünlü, M. Selim
Subject Terms: Electrical engineering, Binding affinity, Interferometry, Label-free
Relation: https://hdl.handle.net/2144/43089; orcid:0000-0001-8228-2678
Availability: https://hdl.handle.net/2144/43089
Authors: Ghani, Muhammad Usman
Contributors: Karl, W. Clem
Subject Terms: Electrical engineering, Artifact mitigation, Artificial intelligence, Computed tomography, Data-domain learning, Image reconstruction, Magnetic resonance imaging
Relation: https://hdl.handle.net/2144/41921; orcid:0000-0002-6411-423X
Availability: https://hdl.handle.net/2144/41921
Authors: Abdalla, Iman
Contributors: Little, Thomas D.C.
Subject Terms: Electrical engineering
Relation: https://hdl.handle.net/2144/41883; orcid:0000-0002-7080-1116
Availability: https://hdl.handle.net/2144/41883
Authors: Glasmann, Andreu
Contributors: Bellotti, Enrico
Subject Terms: Electrical engineering
Relation: https://hdl.handle.net/2144/41492; orcid:0000-0002-1179-3240
Availability: https://hdl.handle.net/2144/41492
Authors: Sivadas, Nithin
Contributors: Semeter, Joshua L.
Subject Terms: Electrical engineering
Relation: https://hdl.handle.net/2144/41486; orcid:0000-0003-4278-0482
Availability: https://hdl.handle.net/2144/41486
Authors: Ekiz Kanik, Fulya
Contributors: Ünlü, Selim M.
Subject Terms: Electrical engineering, Assay development, Biosensor, Interferometry, Nucleic acid detection, Protein detection, Virus detection
Relation: https://hdl.handle.net/2144/41477; orcid:0000-0003-2662-7832
Availability: https://hdl.handle.net/2144/41477